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Extended X-ray Absorption Fine Structure

INTEGRATED XAFS SOLUTION

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A complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray 

Absorption Near Edge Structure (XANES) measurements.

In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid 

detector together with a software suite to control instrument functions and analyze data. Spectra 

quality is on par with synchrotron measurements hence beamtime application is not required.

The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K 

absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the 

spectrometer yields an extremely high signal-to-noise ratio.This results in the analyte 

concentration being weighted lowly at few percentage.The instrument combines high efficiency 

with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered 

absorption edges.

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Features

Table-top XAFS system

Synchrotron-quality spectra

Applications

 First integrated lab-based EXAFS and XANES solution

 Beamtime does not require appliction

 Fast polychromatic acquisition

 Energy range 5 to 12keV

 High resolving power of 4000

 Wide bandpass of up to 1keV

 Chemical state analysis for geology, biology, materials research

 Information on atomic distances, oxidation state, coordination 

    number 

 Analysis of K-absorption edges of 3d-transition metals

Element Range

 Range of elements accessible to  hiXAS for EXAFS and XANES 

    measurements. 

 Even diluted samples with analyte concentrations of only a few 

    weight percent can be measured in a time frame of several

    minutes.


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 Sample XAFS measurement of a 10um Cu foil, comparing lab-based (red) 

     and synchrotron (black) results.

 EXAFS oscillations (left) and corresponding Fourier transformation (right).

 Acquisition time: 3min with sample, 1.5min without sample.

 X-ray absorption spectrum of a 6um-thick Ni foil. Comparison 

    to the spectrum.

 Obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000)

 Shows the high quality results of the tabletop instrument.

 All relevant spectral features are present, allowing for the 

   determination of chemical compounds

 Application

  Chemical speciation and concentration ratios

  Compound research

  Short range order and bond length determination

  Catalyst analysis



   Specifications
   Topology   X-ray tube source von Hamos HAPG spectrometer hybrid detector
   Energy range   5-12keV
   Analyte concentration   Own to a few wt%
   Sample mount   Turret mount for multiple samples


   Footprint   2.0m x 1.0m
   Software suite   Integrated system control, variety of spectra calibration and analysis functions




   EXAFS mode   XANES mode
   Resolving power   1800   4000
                                                                                                                                                        Constant over the whole energy range
   Energy bandpass   1000eV   300eV
   Acquisition time   3min   8min


                                                                                                                                                                       Normalized to analyte concentration






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Local Same Day Service

SINGAPORE: For same day service, please contact us at 6996 0391. Office Hours: 9am - 6pm (+8GMT)

For more contact information click here.


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