High Resolution Spectrometer 200-1100nm
Back-Illuminated Spectrometer 200-1100nm
Cooled Spectrometers 200-1100nm
Large NA High Sensitivity Spectrometer
Raman Spectrometer 532/785/1064nm
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High-speed Line Scan Confocal Microscope
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Time Correlated Single Photon Counting
Temperature Control Stage 77K
Maskless Lithography UV Laser Writer
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Terahertz TPX Lens
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Terahertz Crystal
780nm Femtosecond Laser
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Photodiode & Photomultiplier (200nm-12um)
Infrared Linear Detector /LVF (2-12um)
Standard Beam Profiler (190-1100nm)
1inch Aperture Beam Profiler (190-1100nm)
SWIR Beam Profiler (900-1700nm)
IR Beam Profiler (2-16um)
Terahertz Beam Profiler(1-18 THz)
Scanning Slit Beam Profiler (190-2500nm)
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2000nm Widely Tuneable Laser
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Broadband Femtosecond Laser 950-1150nm
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ASE/SLD Light Sources (850-2000nm)
IR Emitter Chip (2-14um)
Light & Wavelength Selector
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White Light Interferometer
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High Powered Hollow-Core Fiber Compressor
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ID900 Timing Controller
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Optical Diffuser
Our White Light Interferometer GOBI uses spectrally resolved interferometry to accurately
measure the Group Delay Dispersion (GDD) of multi-layered ultrafast optics. The device
has been developed at the MaxPlanck-Institute of Quantum Optics (Garching, Germany)
to characterize and refine some of the most advanced coatings to date [1-3]. Combining
spectral with temporal information and the possibility to accumulate multiple passes over
the same optic ensures reliable results with unique spectral coverage of up to
250-1060 nm (UV/VIS/NIR version) and 900-2400 nm (IR version). Spectrally resolved
detection makes reference lasers together with any related test sample
restrictions on specific reflection or transmission bands obsolete. This opens
the full spectral range to characterize even ultra-broadband or advanced
narrowband coatings. The flexible optical setup can measure
mirrors and transparent samples under angles of incidence variable between
0 and 70 degrees.
Key Product Features:
Ultrabroad spectral coverage • 400-1060 nm (VIS/NIR basic version) • 250-1060 nm (UV/VIS/NIR version) • 900-2400 nm (IR version)
Direct spectrally dispersed measurement with a spectrometer
No need for reference lasers, no requirements on specific reflectivity
s and p polarization (separately)
Angle of incidence: 0° and 5-70°
Measurement of single mirrors or mirror pairs
Laptop and userfriendly software interface included
Footprint 45 x 45 cm2
Gobi is based on a Michelson Interferometer with an incoherent white light (WL) source. Data is acquired by scanning the delay of one arm and spectrally record the evolving interference pattern. Fully automated analysis yields the spectral phase and GDD. The spectrometer directly provides the spectrally resolved information avoiding artefacts from time-domain reconstruction. It also provides an intrinsic calibration reference for the delay scan, so that no additional reference lasers are required. This makes GOBI suitable for any optics measurements in the detection range without the need to cover a reference laser wavelength in transmission or reflectance.
In contrast to other devices GOBI is able to resolve strong GDD oscillations.
Note that differences between measured and theoretical curves reflect tolerances
in the manufacturing process of the coatings.
Examples of GDD measurements with our White Light Interferometer GOBI, and comparison
to the theoretical design.
(a) Ultrabroadband PC70 mirrors with our unique doubleangle design,
measured at 5° and 19° angle of normal incidence, together with the average.
(b) Pulse Compression Mirror PC1921 for the infrared. (c) High dispersive HD73 mirror with
-3000 fs2 per bounce at 1030 nm.
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