LIV Test Systems for Laser Diode / LED

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Products / Light Analysis /Measurement System /LIV Test Systems for Laser Diode / LED /

LIV Test Systems for Laser Diode / LED

Overview Specification Operation Order Now!

Laser Diode and LED Testing System are measurement systems for the electro-optical characterization of laser diodes and LEDs, whether packaged or in bare chip form. These instruments perform complete LIV measurements in extremely short time for high throughput by using pulse testing method, QCW and CW testing including burn-in.

Product Brochures:Laser Diode Test System | Laser Diode Test System LIV120 | Laser Diode Test System LIV120

Laser Diode Characterization System LIV100

(Pulse Testing Only)

Maximum currents: 250mA up to 600A

Maximum number of current steps: 4000

Interface: USB

Rise time: 50ns (F-version); 500ns (L-version); 1us (XL-version)

Throughput: Typically 1s per device

Rise time: 50ns; 500ns; 1us

Laser Diode Characterization System LIV120

(Pulsed, QCW and CW testing including burn-in)

Maximum currents: 250mA up to 1200A

Maximum number of current steps: 4000

Interface: USB

Throughput: Typically 1s per device

Rise Time: 5us

Product Brochures:

Laser Diode Test System | Laser Diode Test System LIV120 | Laser Diode Test System LIV120

LIV 100

Inputs:
2x Transimpedance amplifier (1x reserved for power input, 1x free for second power channel)
2x A/D converter reserved for current and voltage inputs
Sampling rate		selectable: 20/n MS/s with n=1..20	n.a.	1		20	MS/s
A/D Resolution					13		bit
Photodiode gain		optimum gain			1		V/mA
Photodiode gain		automatically selected			10		V/mA
Transimpedance amplifier rise time1		Input capacitance <20pF, gain = 1kΩ			50		ns
Output
Pulse duration2	F	20MS/s sampling rate	0.05	0.15		100	µs
Pulse duration2	F	1MS/s sampling rate	1	1		2000	µs
Pulse duration2	L	20MS/s sampling rate	0.05	2		100	µs
Pulse duration2	L	1MS/s sampling rate	1	2		2000	µs
Pulse duration2	XL	20MS/s sampling rate	0.05	5		100	µs
Pulse duration2	XL	1MS/s sampling rate	1	5		2000	µs
Rise time		F			701	100	ns
		L			420	500
		XL			700	1000
Current overshoot at maximum current5					0	5	%
Pulse separation		selectable: 50 ·n µs with n= 2..10 000	50	100		500 000	µs
Repetition rate						100	kHz
Current range (examples only: any current range from 1 A to 600A may be specified at time of purchase)		LIV100-F002, -L002 or -XL002	0.0005	0.01		2	A
		LIV100-F040, -L040 or -XL040	0.01	0.2		40
		LIV100-F080, -L080 or -XL080	0.02	0.4		80
		LIV100-F120, -L120 or -XL120	0.03	0.6		120
		LIV100-L200 or -XL200	0.05	1		200
		LIV120-XL400	0.1	2		400
		LIV120-XL600	0.15	2		600
D/A resolution					12		bit
Compliance voltage				8			V
Duty cycle quick rise version		LIV100-F002				25	%
(examples only: any current range from 1A to 600A may be specified at time of purchase)		LIV100-F040				1.5
		LIV100-F080				0.7
		LIV100-F120				0.5
Duty cycle long pulse version		LIV100-L002				35	%
(Examples only: any current range from 1A to 600A may be specified at time of purchase)		LIV100-L040				2.9
		LIV100-L080				1.5
		LIV100-L120				1
		LIV100-L200				0.6
Duty cycle long pulse version		LIV100-XL002				35	%
(Examples only: any current range from 1A to 600A may be specified at time of purchase)		LIV100-XL040				2.9
		LIV100-XL080				1.5
		LIV100-XL120				1
		LIV100-XL200				0.6
		LIV100-XL400				0.3
		LIV100-XL600				0.2
Signal processing
Depth of storage					512		kB
Number of channels			1	1		250
PC Interface
Type				USB; 100kB/s
Dimensions
		DAQ unit		114 x 150 x 125 (w x l x h)			mm

LIV 120

Input
Maximum power			Depending on the selected integrating sphere and detector head

			See OPM150 series for details!
Monitor diode current	LIV120-250	gain 0	0.0025		10	mA
	LIV120-500	gain 1	0.00025		1	mA
	LIV120-1000	gain 2	0.025		100	µA
	LIV120-2000
Monitor diode current	LIV120-5A or higher		No measurement of monitor diode current
Output
Laser diode current	LIV120-250		0.0625		250	mA
	LIV120-500		0.125		500	mA
	LIV120-1000		0.25		1000	mA
	LIV120-2000		0.5		2000	mA
Laser diode current	LIV120-5A		0.00125		5	A
	LIV120-10A		0.0025		10	A
	LIV120-20A		0.005		20	A
	LIV120-40A		0.01		40	A
Laser diode current	LIV120-L100A		0.025		100	A
	LIV120-L200A		0.05		200	A
	LIV120-L400A		0.1		400	A
	LIV120-L800A		0.2		800	A
	LIV120-L1200A		0.3		1200	A
Compliance voltage	LIV120-250 up to LIV120-2000		8			V
Compliance voltage	LIV120-5A up to LIV120-40A		8			V
Compliance voltage	LIV120-100A		10			V
Compliance voltage	LIV120-200A		20			V
Compliance voltage	LIV120-400A up to LIV120-1200		10			V
Accuracy	LIV120-250 up to LIV120-2000				0.2	%
Accuracy	LIV120-5A up to LIV120-40A				0.2	%
Accuracy	LIV120-100A bis 1200A				0.5	%
Rise time at full rated current	LIV120-250 up to LIV120-2000			2	5	µs
Rise time at full rated current	LIV120-5A up to LIV120-40A			6	10	µs
Rise time at full rated current	LIV120-100A			350	400	µs
Rise time at full rated current	LIV120-200 up to LIV120-1200A			400	500	µs
Pulse duration	LIV120-250 up to LIV120-2000	pulse modes	0.1		60000	ms
Pulse duration	LIV120-250 up to LIV120-2000	CW modes	0.1		120000	ms
Pulse duration	LIV120-5A up to LIV120-40A	Pulse modes	0.22		60000	ms
Pulse duration	LIV120-5A up to LIV120-40A	CW modes	0.22		120000	ms
Pulse duration	LIV120-100A up to LIV120-1200A	Pulse modes	1		60000	ms
Pulse duration	LIV120-100A up to LIV120-1200A	CW modes	1		120000	ms
Duty cycle		Pulse modes	0.0002		99.99	%
Duty cycle		CW modes	0.0002		100	%
Measurement time			200			µs
Measurement time					11	Tage
Number of measurements per channel		LIV modes	1		4000
Number of measurements per channel		Burst modes	1		16380
Number of channels for measurement	LIV120-250 up to LIV120-2000			4
				optical power
				laser current
				laser voltage
				photo diode current
Number of channels for measurement	LIV100-L002			3
	LIV120-5A up to LIV120-1200A			optical power
				laser current
				laser voltage
In General
Power supply	LIV120-250 up to LIV120-2000			Wall plug
Power supply	LIV120-5A up to LIV120-40A			table top power supply
Power supply	LIV120-100A		90		265	V (single phase)
Power supply	LIV120-200A up to LIV120-1200A		342		528	V (three-phase)
Communication				USB2.0
Dimensions	LIV120-250 up to LIV120-2000			130 x 120 x 106 (w x l x h)		mm
Dimensions	LIV120-5A up to LIV120-40A			130 x 120 x 106 (w x l x h)		mm
Dimensions	LIV120-100A			19″ Rack 3U
Dimensions	LIV120-200A up to LIV120-400A			19″ Rack 4U
Dimensions	LIV120-800A			19″ Rack 2 x 4U
Dimensions	LIV120-1200A			19″ Rack 3 x U

LIV100

The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).

-LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns. The longest pulse length at maximum current is typically limited to 10µs.

-LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs. The longest pulse length at maximum current is typically limited to 100µs.

-LIV100-XLxxx: extra-long pulse version with rise time of 1µs. The shortest pulse duration is 5µs. The longest pulse length at maximum current is 2000µs.

Principles Of Operation

All three systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput. The LIV100 operates in pulsed mode only:

Pulse LIV Mode

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:

Pulsed Burst Mode

The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom strip line or contact card configuration service.

LIV120

The LIV120 is a powerful but low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications, ideal for

-Diode characterization

-Quality control of incoming goods

-OEM

We offer this instrument with a variety of end stages covering current ranges from 250mA up to 20A in a compact enclosure and up to 1200A in 19” rack enclosures. The current ranges 250mA to 2A are forced air cooled. Above 2A in the compact enclosure, the unit is liquid cooled. Please contact us if liquid cooling is required for the low current versions. The LIV120 uses our extensive range of OPM150 laser power detector heads with all of the comfort of intelligent head technology for cost efficient swapping of detector heads. This feature is very useful when testing a wide range of wavelengths or when testing free beam and fibre coupled lasers. The measurement cycle typically takes less than 1s including the data transfer to the host computer.

Principles Of Operation

A complete parameter set for a given measurement protocol may be uploaded to the LIV120. The LIV120 then takes over the measurement procedure. The unit drives the laser with the given prescription and performs the data acquisition and storage. The LIV120 operates both in CW and pulsed modes:

CW-LIV Mode

Pulsed LIV Mode

Many laser diodes of the same type may now be tested in this manner with very high throughput. The LIV120 can run in the so-called soft pulse mode. This means that the current between pulses in pulsed mode operation does not drop down to zero, but rather to the value of the minimum current set by the operator. Note the very clean, square shape of the current pulses.

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. All parameters (power, currents and voltage) are measured in this mode. Schematically this appears as follows:

CW-Burst Mode

Pulsed Burst Mode

The burst mode is useful for lifetime testing, checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom connection line or contact card configuration service.

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