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Laser Diode LIV Testing Systems

Product Brochures:

Laser Diode Test System | Laser Diode Test System LIV120Laser Diode Test System LIV120


 The LIV series of instruments, LIV100 and LIV120 are measurement systems for the electro-optical characterization of laser diodes and LEDs, whether packaged 

 or in bare chip form. These instruments perform complete LIV measureme nts in extremely short time for high throughput by using pulse testing method, QCW and 

 CW testing including burn-in.


 Laser Diode Characterization System LIV100

 (Pulse Testing Only)


 Maximum currents:

 Maximum number of current steps:

 Interface:

 Rise time:

 Throughput:

Rise time 







 250mA up to 600A

 4000

 USB

 50ns (F-version); 500ns (L-version); 1us (XL-version)

 Typically 1s per device

50ns;  500ns;  1us

image.png


 Laser Diode Characterization System LIV120

 (Pulsed, QCW and CW testing including burn-in)


 Maximum currents:

 Maximum number of current steps:

 Interface:

 Throughput:

Rise Time







 250mA up to 1200A

 4000

 USB

 Typically 1s per device

5us

image.png



Product Brochures:

Laser Diode Test System | Laser Diode Test System LIV120 | Laser Diode Test System LIV120

LIV 100


Inputs:

2x Transimpedance amplifier (1x reserved for power input, 1x free for second   power channel)

2x A/D converter reserved for current and voltage inputs

Sampling rate


selectable: 20/n MS/s with n=1..20

n.a.

1


20

MS/s

A/D Resolution





13


bit

Photodiode gain


optimum gain



1


V/mA

automatically selected

10

Transimpedance amplifier rise time1


Input capacitance <20pF, gain = 1kΩ



50


ns

Output

Pulse duration2

F

20MS/s sampling rate

0.05

0.15


100

µs

1MS/s sampling rate

1

1

2000

Pulse duration2

L

20MS/s sampling rate

0.05

2


100

µs

1MS/s sampling rate

1

2

2000

Pulse duration2

XL

20MS/s sampling rate

0.05

5


100

µs

1MS/s sampling rate

1

5

2000

Rise time


F



701

100

ns

L

420

500

XL

700

1000

Current overshoot at maximum current5





0

5

%

Pulse separation


selectable: 50 ·n µs with n= 2..10 000

50

100


500 000

µs

Repetition rate






100

kHz

Current range (examples only: any current range from 1 A to 600A may be specified at time of purchase)


LIV100-F002, -L002 or -XL002

0.0005

0.01


2

A

LIV100-F040, -L040 or -XL040

0.01

0.2

40

LIV100-F080, -L080 or -XL080

0.02

0.4

80

LIV100-F120, -L120 or -XL120

0.03

0.6

120

LIV100-L200 or -XL200

0.05

1

200

LIV120-XL400

0.1

2

400

LIV120-XL600

0.15

2

600

D/A resolution





12


bit

Compliance voltage




8



V

Duty cycle quick rise version


LIV100-F002




25

%

(examples only: any current range from 1A to 600A may be specified at time of purchase)

LIV100-F040

1.5


LIV100-F080

0.7


LIV100-F120

0.5

Duty cycle long pulse version


LIV100-L002




35

%

(Examples only: any current range from 1A to 600A may be specified at time of purchase)

LIV100-L040

2.9


LIV100-L080

1.5


LIV100-L120

1


LIV100-L200

0.6

Duty cycle long pulse version


LIV100-XL002




35

%

(Examples only: any current range from 1A to 600A may be specified at time of purchase)

LIV100-XL040

2.9


LIV100-XL080

1.5


LIV100-XL120

1


LIV100-XL200

0.6


LIV100-XL400

0.3


LIV100-XL600

0.2

Signal processing

Depth of storage





512


kB

Number of channels



1

1


250


PC Interface

Type




USB; 100kB/s


Dimensions



DAQ unit


114 x 150 x 125 (w x l x h)

mm


LIV 200


Input

Maximum power



Depending on the selected integrating sphere and detector head


See OPM150 series for details!

Monitor diode current

LIV120-250

gain 0

0.0025


10

mA

LIV120-500

gain 1

0.00025

1

mA

LIV120-1000

gain 2

0.025

100

µA

LIV120-2000





Monitor diode current

LIV120-5A or higher


No measurement of monitor diode current


Output

Laser diode current

LIV120-250


0.0625


250

mA

LIV120-500

0.125

500

mA

LIV120-1000

0.25

1000

mA

LIV120-2000

0.5

2000

mA

Laser diode current

LIV120-5A


0.00125


5

A

LIV120-10A

0.0025

10

A

LIV120-20A

0.005

20

A

LIV120-40A

0.01

40

A

Laser diode current

LIV120-L100A


0.025


100

A

LIV120-L200A

0.05

200

A

LIV120-L400A

0.1

400

A

LIV120-L800A

0.2

800

A

LIV120-L1200A

0.3

1200

A

Compliance voltage

LIV120-250 up to LIV120-2000


8



V

Compliance voltage

LIV120-5A up to LIV120-40A


8



V

Compliance voltage

LIV120-100A


10



V

Compliance voltage

LIV120-200A


20



V

Compliance voltage

LIV120-400A up to LIV120-1200


10



V

Accuracy

LIV120-250 up to LIV120-2000




0.2

%

Accuracy

LIV120-5A up to LIV120-40A




0.2

%

Accuracy

LIV120-100A bis 1200A




0.5

%

Rise time at full rated current

LIV120-250 up to LIV120-2000



2

5

µs

Rise time at full rated current

LIV120-5A up to LIV120-40A



6

10

µs

Rise time at full rated current

LIV120-100A



350

400

µs

Rise time at full rated current

LIV120-200 up to LIV120-1200A



400

500

µs

Pulse duration

LIV120-250 up to LIV120-2000

pulse modes

0.1


60000

ms

CW modes

0.1

120000

Pulse duration

LIV120-5A up to LIV120-40A

Pulse modes

0.22


60000

ms

CW modes

0.22

120000

Pulse duration

LIV120-100A up to LIV120-1200A

Pulse modes

1


60000

ms

CW modes

1

120000

Duty cycle


Pulse modes

0.0002


99.99

%

CW modes

0.0002

100

%

Measurement time



200



µs

Measurement time





11

Tage

Number of   measurements per channel


LIV modes

1


4000


Burst modes

1

16380

Number of channels   for measurement

LIV120-250 up to   LIV120-2000



4



optical power

laser current

laser voltage

photo diode current

Number of channels for measurement

LIV100-L002



3



LIV120-5A up to   LIV120-1200A

optical power


laser current


laser voltage

In General

Power supply

LIV120-250 up to LIV120-2000



Wall plug



Power supply

LIV120-5A up to LIV120-40A



table top power supply



Power supply

LIV120-100A


90


265

V (single phase)

Power supply

LIV120-200A up to LIV120-1200A


342


528

V (three-phase)

Communication




USB2.0



Dimensions

LIV120-250 up to LIV120-2000



130 x 120 x 106 (w x l   x h)


mm

Dimensions

LIV120-5A up to   LIV120-40A



130 x 120 x 106 (w x l   x h)


mm

Dimensions

LIV120-100A



19″ Rack 3U



Dimensions

LIV120-200A up to LIV120-400A



19″ Rack 4U



Dimensions

LIV120-800A



19″ Rack 2 x 4U



Dimensions

LIV120-1200A



19″ Rack 3 x U






LIV100 

The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).

-LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns. The longest pulse length at maximum current is typically limited to 10µs.

-LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs. The longest pulse length at maximum current is typically limited to 100µs.

-LIV100-XLxxx: extra-long pulse version with rise time of 1µs. The shortest pulse duration is 5µs. The longest pulse length at maximum current is 2000µs.


Principles Of Operation

All three systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput. The LIV100 operates in pulsed mode only: 


image.png


Pulse LIV Mode

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:


image.png


Pulsed Burst Mode

The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom strip line or contact card configuration service.





LIV120

The LIV120 is a powerful but low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications, ideal for

-Diode characterization

-Quality control of incoming goods

-OEM

We offer this instrument with a variety of end stages covering current ranges from 250mA up to 20A in a compact enclosure and up to 1200A in 19” rack enclosures. The current ranges 250mA to 2A are forced air cooled. Above 2A in the compact enclosure, the unit is liquid cooled. Please contact us if liquid cooling is required for the low current versions. The LIV120 uses our extensive range of OPM150 laser power detector heads with all of the comfort of intelligent head technology for cost efficient swapping of detector heads. This feature is very useful when testing a wide range of wavelengths or when testing free beam and fibre coupled lasers. The measurement cycle typically takes less than 1s including the data transfer to the host computer.


Principles Of Operation

A complete parameter set for a given measurement protocol may be uploaded to the LIV120. The LIV120 then takes over the measurement procedure. The unit drives the laser with the given prescription and performs the data acquisition and storage. The LIV120 operates both in CW and pulsed modes: 


image.png


CW-LIV Mode

image.png


Pulsed LIV Mode

Many laser diodes of the same type may now be tested in this manner with very high throughput. The LIV120 can run in the so-called soft pulse mode. This means that the current between pulses in pulsed mode operation does not drop down to zero, but rather to the value of the minimum current set by the operator. Note the very clean, square shape of the current pulses.


image.png


The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. All parameters (power, currents and voltage) are measured in this mode. Schematically this appears as follows:


image.png


CW-Burst Mode


image.png

Pulsed Burst Mode


The burst mode is useful for lifetime testing, checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom connection line or contact card configuration service.





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For technical assistance, custom orders or email quotations, drop us an email at info@simtrum.com.

We will get back to you within 1 working days.


Local Same Day Service

-Singapore Main office:  Call us at +65 6996 0391 Office Hours: 9am - 6pm (+8GMT)
-China Shanghai Main office:Call us at +86 1500085 3620. Office Hours: 9am - 6pm (+8GMT)
For Other Internation sales office  
click here.


Spectroscopy & Microscopy Solution

Check our solution page Spectroscopy Solutions | Microscopy Solutions



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