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Near Edge X-ray Absorption Fine Structure

 proXAS

 table-top NEXAFS

 proXAS is the first system on the market to offer NEXAFS  measurements in a 

 laboratory.

 Fingerprinting for element analysis is now possible in-house with fast and 

 accurate  results.

 It combines a highly-reliable laser-based XUV source and a customized 

 spectrometer with an extremely high resolving power of 1900. 

 The energy range 200-1200eV allows for measurements at the K-edge of

 elements such as C, N, O, Ca, K, Ti.

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Features

Integrated NEXAFS  system

 First integrated table-top NEXAFS spectroscopy solution

 No need to apply and wait for beamtime

 Chemical state analysis for geology, biology, materials 

    research

 Fast polychromatic acquisition

Synchrotron-quality spectra

 Energy range 200 to 1200eV

 High resolving power of 1900

 Extremely high surface sensitivity

 Information on molecular orbitals, oxidation 

    state, coordination number

 Software suite for spectra analysis

Applications

 Analysis of organic materials, e.g. 

    lipid membranes, humic acids,polymer 

    films, especially at carbon K-absorption 

    edge

 Surface-sensitive chemical analysis of C, N, 

    O, Ca, K, Ti

image.png


     NEXAFS spectrum at the carbon K-edge of a polyimide film 

        (t=200nm), measured with tabletop system, averaged over 

        60 pulses.

     Insert, NEXAFS spectrum recorded at a synchrotron for comparison.

     XUV light source using a highly-reliable laser produced plasma.

     Energy range  200-1200eV.

     Repetition rate 25Hz


    Results

image.png

   NEXAFS spectrum at the carbon K-edge of a polyimide film (t=200nm).

   (1) measured with the table-top system, averaging over 60 pulses.

   (2) NEXAFS spectrum recorded at a synchrotron for comparison


  Application

   Surface science

   Chemical state analysis in geochemistry

   Electronic structure and oxidation state analysis




 Specifications
 Source debris-free laser-produced plasma XUV source
 Energy range 200-1200eV / 1-6nm
 Repetition rate 25Hz

 Source power stability

 ±1.5%
 Spectrometer aberration-corrected flat-field spectrometer
 Resolving power 1900
 Sample mount turret mount for multiple samples
 Footprint 1.5m x 1.0m
 Software suite integrated system control, variety of spectra calibration and analysis functions



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New users will be given the opportunity to register. Join our mailing list and follow us on linkedin for constant updates.


Technical Assistance and Email Quotations (Recommended for Custom Orders, inquiries)

For technical assistance, custom orders or email quotations, drop us an email at info@simtrum.com.

We will get back to you within 3 working days.


Local Same Day Service

SINGAPORE: For same day service, please contact us at 6996 0391. Office Hours: 9am - 6pm (+8GMT)

For more contact information click here.


International Inquiries

SIMTRUM provides worldwide shipping and inquiry management. Please contact us for more information.





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