SIMTRUM Photonics Store

Sign In

  • Forgot your password?
  • Need a new account?


Near Edge X-ray Absorption Fine Structure


 table-top NEXAFS

 proXAS is the first system on the market to offer NEXAFS  measurements in a 


 Fingerprinting for element analysis is now possible in-house with fast and 

 accurate  results.

 It combines a highly-reliable laser-based XUV source and a customized 

 spectrometer with an extremely high resolving power of 1900. 

 The energy range 200-1200eV allows for measurements at the K-edge of

 elements such as C, N, O, Ca, K, Ti.



Integrated NEXAFS  system

 First integrated table-top NEXAFS spectroscopy solution

 No need to apply and wait for beamtime

 Chemical state analysis for geology, biology, materials 


 Fast polychromatic acquisition

Synchrotron-quality spectra

 Energy range 200 to 1200eV

 High resolving power of 1900

 Extremely high surface sensitivity

 Information on molecular orbitals, oxidation 

    state, coordination number

 Software suite for spectra analysis


 Analysis of organic materials, e.g. 

    lipid membranes, humic acids,polymer 

    films, especially at carbon K-absorption 


 Surface-sensitive chemical analysis of C, N, 

    O, Ca, K, Ti


     NEXAFS spectrum at the carbon K-edge of a polyimide film 

        (t=200nm), measured with tabletop system, averaged over 

        60 pulses.

     Insert, NEXAFS spectrum recorded at a synchrotron for comparison.

     XUV light source using a highly-reliable laser produced plasma.

     Energy range  200-1200eV.

     Repetition rate 25Hz



   NEXAFS spectrum at the carbon K-edge of a polyimide film (t=200nm).

   (1) measured with the table-top system, averaging over 60 pulses.

   (2) NEXAFS spectrum recorded at a synchrotron for comparison


   Surface science

   Chemical state analysis in geochemistry

   Electronic structure and oxidation state analysis

Please check the table below for individual specifications

Product Brochure English: Near Edge X-ray Absorption Fine Structure

 Source debris-free laser-produced plasma XUV source
 Energy range 200-1200eV / 1-6nm
 Repetition rate 25Hz

 Source power stability

 Spectrometer aberration-corrected flat-field spectrometer
 Resolving power 1900
 Sample mount turret mount for multiple samples
 Footprint 1.5m x 1.0m
 Software suite integrated system control, variety of spectra calibration and analysis functions

Automatic Quotation Generation (Recommended)

To generate an automatic quotation request please login using the Sign In button (top right of the screen). 

New users will be given the opportunity to register. Join our mailing list and follow us on linkedin for constant updates.

Email Quotations 

For technical assistance, custom orders or email quotations, drop us an email at

We will get back to you within 1 working days.

Local Same Day Service

-Singapore Main office:  Call us at +65 6996 0391 Office Hours: 9am - 6pm (+8GMT)
-China Shanghai Main office:Call us at +86 1500085 3620. Office Hours: 9am - 6pm (+8GMT)
For Other Internation sales office  
click here.

Spectroscopy & Microscopy Solution

Check our solution page Spectroscopy Solutions | Microscopy Solutions

Search Reset
Compare Model Drawings & Specs Availability Reference Price
4-6 Weeks Request for quote

NEXAFS - Parameter

NEXAFS - Download


Compare Model Drawings & Specs Availability Reference Price