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Compact Beam Profiler（190-1100nm） | SIMTRUM Photonics Store

Products / Light Analysis /Laser Beam Profilers /Compact Beam Profiler（190-1100nm） /
Compact Beam Profiler（190-1100nm）
Overview & Specifications Software Application case Related Products Order Now！
SIMTRUM's compact beam analyzer is easy to carry and deploy, and provides basic two-dimensional beam analysis functions, including measurement of spot size, divergence Angle and other parameters, suitable for experimental scenarios where space is limited or convenience is required. At the same time, the compact beam analyzer has an output power of up to 50W. We also provide product software for measurement display.

Features

  • Compact structure
  • High output power
  • Stray light interference is low
  • Large photometric spot range
  • Wavelength response range 190-1100nm
  • Compatible with continuous and pulsed light

 

Applications

  • Optical fiber inspection
  • Product quality control
  • Laser beam profile analysis
  • Photoelectric test and inspection

 

Specifications

General Parameters

Model LA-CC01-BP-C LA-CC01-BPH-C
  Spectral Range 190-340nm/340-1100nm 190-340nm/340-1100nm
  Sensor Size 8.4*7.1mm 14.1*10.4mm
  Minimal Beam Size 35μm
  Maximum Beam Size 7.1mm 10.4mm
  Maximum Acceptance Angle Collimated: ±2.5° Focused: NA0.08
  Minimal Power 1mW
  Maximum Power 50W
  Detection Time 50W/2 minutes
  Parfocal Tolerance 0.05mm
  Defocusing Measurement Range ±5mm, calculated based on the parfocal distance of 95mm
 
Other Parameters
Attenuator 190-340nm：OD1/OD2/OD3/OD4
340-1100nm：OD1/OD2/OD3/OD4.5
  Communication Interface USB 3.0
  External Triggering Available
  Operating Environment Temperature＜0~35℃: Relative humidity＜60%; Pointing test temperature: 15-25℃
  Operating System Windows 10/11, Optimum resolution: 1920*1080
  Weight ＜1Kg
  Incoming Light Direction Vertical(optional)
  Warranty 1 year

Main functions

  • Save/store video
  • Laser power calibration
  • Multichannel spot monitoring
  • Supports manual and automatic real-time exposure and gain adjustment
  • Measurable spot stability (directivity)
  • Interface High-speed USB3.0\GigE interface
  • Custom enhanced display of measurement results

Function examples

Spot tracking
3D display
XY display

 

Application case

 

Laser detection
 
Beam quality detection, focus calibration 
 
Products Dimension


Application case

 

Laser detection
 
Beam quality detection, focus calibration 
 
Products Dimension


Related products

Model Wavelength Range Resolution Sensor pixel size Max. Power
IR Beam Profiler (2-16um) | SIMTRUM Photonics Store 190-1100nm Up to 4096*3072 3.45 um 1W
Terahertz Beam Profiler(3-20 THz) | SIMTRUM Photonics Store 350-1750nm Up to 1920*1080 5 um 1W
Scanning Slit Beam Profiler (190-2500nm) | SIMTRUM Photonics Store 190-1100nm Up to 1920*1080 / 50W
IR Beam Profiler 2-16 um 540*480 17 um /
Terahertz Beam Profiler 3-20 THz Up to 2048*2048 5.5 um /
Scanning Slit Beam Profiler 190-2500nm / / /

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Compare Model Drawings & Specs Availability Reference Price
(USD)
LA-CC01-BP-C
Spectral Range 190-340nm/340-1100nm，Sensor Size 8.4*7.1mm，Beam Size 35μm-7.1mm，Power range 1mW-50W，Defocusing Measurement Range ±5mm 		4-6week $5954.43
LA-CC01-BPH-C
Spectral Range 190-340nm/340-1100nm，Sensor Size 14.1*10.4mm，Beam Size 35μm-10.4mm，Power range 1mW-50W，Defocusing Measurement Range ±5mm 		4-6week $7151.72

LA-CC01-BPH-C - Parameter

LA-CC01-BP-C - Parameter

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LA-CC01-BP-C - Download

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Sales Enquiry：+65 6996 0391       Email：info@simtrum.com      

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