UV-VIS Beam Profiler（190-1100nm） | SIMTRUM Photonics Store

SIMTRUM'S Beam Profiler receives the beam focused or directly projected by the optical system through the CMOS detector, and its built-in processing system processes the detector data to provide beam characteristics such as beam intensity distribution, spot shape, size and beam quality by capturing and analyzing the beam intensity distribution in two and three dimensions. It is often used in the fields of laser system optimization, beam quality evaluation and beam monitoring.

Features High resolution Externally triggered Large dynamic range Wide spectral coverage Wide range of spot diameters can be measured

Applications Laser processing Spot profile analysis of lasers Evaluation of laser beam quality Optical path pointing stability testing Laser imaging and optical inspection

Main functions

• Save/store video
• Laser power calibration
• Multichannel spot monitoring
• Supports manual and automatic real-time exposure and gain adjustment
• Measurable spot stability (directivity)
• Interface High-speed USB3.0\GigE interface
• Custom enhanced display of measurement results

Function examples

Spot tracking	3D display
XY display

 

Application case

 

Laser detection

 

Beam quality detection, focus calibration 

 

Products Dimension

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