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Scanning Slit Beam Profiler

Product Brochure: BeamMap2 - XYZΘΦ | Selection Guide


Features

·   190 to 1150 nm, Silicon detector

·   650 to 1800 nm, InGaAs detector

·   1000 to 2300 or 2500 nm, InGaAs (extended) detector

·   Multiple plane spacing options available

·   Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*

·   Port-powered USB 2.0; flexible 3 m cable; no power brick

·   0.1 µm sampling and resolution

·   Linear & log X-Y profiles, centroid

·   Profile zoom & slit width compensation

·   Real-time multiple Z plane scanning slit system

·   Real-time XYZ profiles, Focus position

·   Real-time M², Divergence, Collimation, Alignment

Applications

·  Laser printing & marking

·   Medical lasers

·   Diode laser systems

·   Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging 

   waveguides and fiber ends

·   Development, production, field service

·   CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]

·   M² measurement with available M2DU stage


Specifications

ParametersDetails
WavelengthSi detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned   Beam DiametersSi detector: 5 µm to 4 mm,   to 2 µm in Knife-Edge mode*
InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*
InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode*
Plane   Spacing (4XY models)100 µm: -100, 0, +100, +400   µm
250 µm: -250, 0, +250, +1000 µm
500 µm: -500, 0, +500, +2000 µm
750 µm: -750, 0, +750, +3000 µm
Plane   Spacing (3XYKE models)50 µm: -50, 0, +50, 0 µm
100 µm: -100, 0, +100, 0 µm
Beam   Waist Diameter MeasurementSecond moment (4s) diameter   to ISO 11146; Fitted Gaussian & TopHat
1/e² (13.5%) width
User selectable % of peak
Knife-Edge mode* for very small beams
Beam   Waist Position Measurement± 20 µm best in X, Y, and Z   — contact DataRay for recommendation
Measured   SourcesCW; Pulsed lasers, F µm =   [500/(PRR in kHz)]
Resolution   Accuracy0.1 µm or 0.05% of scan   range
± < 2% ± = 0.5 µm
M²   Measurement1 to > 20, ± 5%
Divergence/Collimation,   Pointing1 mrad best — contact   DataRay for recommendation
Maximum   Power & Irradiance1 W Total & 0.5 mW/µm²
Gain   Range1,000:1 Switched 4,096:1 ADC   range
Displayed   GraphicsX-Y-Z Position &   Profiles, Zoom x1 to x16
Update   Rate~5 Hz
Pass/Fail   DisplayOn-screen selectable   Pass/Fail colors. Ideal for QA & Production.
AveragingUser selectable running   average (1 to 8 samples)
StatisticsMin., Max., Mean, Standard   Deviation
Log data over extended periods
XY   Profile & CentroidBeam Wander display and   logging
Minimum   PC RequirementsWindows, 2 GB RAM, USB   2.0/3.0 port


BeamMap2 Laser Beam Profiler


Product Brochure: Beam'R2 -XY | Selection Guide


Features

·         190 to 1150 nm, Silicon detector

·         650 to 1800 nm, InGaAs detector

·         1000 to 2300 or 2500 nm, InGaAs (extended) detector

·         Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode

·         Port-powered USB 2.0; flexible 3 m cable; no power brick

·        0.1 µm sampling and resolution

·         Linear & log X-Y profiles, centroid

·         Profile zoom & slit width compensation

·         Economical and accurate

·         M² option – beam propagation analysis, divergence, focus

Applications

·        Laser printing & marking

·         Medical lasers

·         Diode laser systems

·         Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging 

       waveguides and fiber ends

·         Development, production, field service

·         CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]

·         M² measurement with available M2DU stage


Specifications

ParametersDetails
WavelengthSi detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to   2300 or 2500 nm
Scanned Beam DiametersSi detector: 5 µm to 4 mm‚   to 2 µm in Knife-Edge mode
InGaAs detector: 10 µm to 3 mm‚ to 2 µm   in Knife-Edge mode
InGaAs (extended) detector: 10 µm to 2   mm‚ to 2 µm in Knife-Edge mode
Beam Waist Diameter MeasurementSecond moment (4s) diameter   to ISO 11146; Fitted Gaussian & TopHat
1/e² (13.5%) width
User selectable % of peak
Knife-Edge mode for very small beam
Measured   SourcesCW; Pulsed lasers‚ Φ µm ≥   [500/(PRR in kHz)]
Resolution Accuracy0.1 µm or 0.05% of scan   range
± < 2% ± = 0.5 µm
Maximum   Power & Irradiance1 W Total & 0.5 mW/µm²
Gain   Range1‚000:1 Switched; 4‚096:1   ADC range
Displayed   GraphicsX-Y Position & Profiles‚   Zoom x1 to x16
Update   Rate~5 Hz
Pass/Fail   DisplayOn-screen selectable   Pass/Fail colors. Ideal for QA & Production.
AveragingUser selectable running   average (1 to 8 samples)
StatisticsMin.‚ Max.‚ Mean‚ Standard   Deviation
Log data over extended periods
XY   Profile & CentroidBeam Wander display and   logging
Minimum   PC RequirementsWindows, 2 GB RAM, USB   2.0/3.0 port



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Spectroscopy & Microscopy Solution

Check our solution page Spectroscopy Solutions | Microscopy Solutions



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