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Tensile Micro-strain Stage

WT-500 is a device which allows users to perform material stress and strain testing process under temperature control with the DIC microtest system. Ideal for testing material phase transformation behaviour, crack initiation, propagation, fracture bending and etc. in high temperatures , the WT-500 is a device suited for the semiconductor, ceramics, polymer materials, biology, flexible electronic materials and other research fields.



Key Features

Dynamic strain measurement

High-speed deformation measurement

Fracture mechanics

Dynamic material test


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Cold and Hot Tensile Microtest System


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Electrical Tests


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Tensile Tester


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Tensile Microtest Result



General Specifications

Optical Indicators

Typical Value

Remarks

Product/Model

WT-500


Tension Range

0-500N, 0.02% FS


Direction

Horizontal movement


Maximal Displacement

40mm


Displacement Speed

1-500μm/s

Optional

Mechanical Model

Stretch, compress, bend


Hot and Cold Method

Liquid nitrogen refrigeration, electric heating wire heating, semiconductor heating   and cooling


Upper Limit of Temperature Control

A.100    B.   200    C. 400    D.600

Optional

Lower Limit of Temperature Control

A.-100    B.-120    C.-150   D.-190optional

Optional

Precision of Temperature Control

±0.1>-120),±0.3<-160),resolution 0.1


Temperature Control Speed

0~10/min


Temperature Control Type

Temperature   control mode

PIDTemperature sensor

PT100Material of sample loader: silver


Light Path

Reflected light path

Transmitted light path available

Windows

Removable and replaceable window

Different materials to achieve different wavelengths

Cover Window

φ25mm


Light Transmission Hole

No light transmission hole

Light transmission hole available

Lens Working Distance

12mm


Window Defrosting

Blowing and defrosting under negative temperature


Selection of The Observation

Microscope, DIC image analysis and testing


DIC Software Analysis Function

Support synchronization analysis, temperature, sample microstructure, strain analysis, dynamic strain calculation, strength, and nonlinear change detection, young's modulus and position's ratio, elastic-plastic fracture mechanics performance, uniform and non-uniform material deformation behaviour in the process of analysis, all kinds of isotropic and anisotropic material deformation characteristics


DIC Test Accuracy

Support low speed to high speed camera, can achieve accuracy micron level, nanometre   level

Optional

Real-time Computing

With   online and offline computing and processing modes


DIC System Compatibility

Compatible with single-camera 2D measurement and multi-camera 3D measurement; Compatible with 32-bit and 64-bit systems.


Sample Table Size

35mm x 8mm

Customizable

Atmosphere Control

Airtight chamber, can be filled with protective atmosphere


Shell Cooling

Default none, selectable circulating water to prevent overheating of the shell

Vertical installation available



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Spectroscopy & Microscopy Solution

Check our solution page Spectroscopy Solutions | Microscopy Solutions



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