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XUV Spectrometers (1-200nm)

XUV Spectrometer Specification Comparison

Brochures English: maxLIGHT pro | easyLIGHT | beamLIGHT | nanoLIGHT | highLIGHT 

产品册中文: maxLIGHT pro | easyLIGHT | beamLIGHT | nanoLIGHT | highLIGHT 

Optical Indicators

Typical Value

Remarks

Product Model

maxLIGHT Pro (XUV)

easyLIGHT (XUV)

highLIGHT(XUV)


Wavelength (nm)

5 to 80

30 to 250

1 to 100


Dispersion

0.5 to 1.3nm/mm

~2.0nm/mm

-


Resolution  

<0.028nm   at 40nm

<0.1nm

-


Flat-field Size

-

75mm

-


Deviation Angle

-

94°

-


Source Distance

Flexible 


Detector

CCD or   MCP/CMOS 


Operating Pressure (mbar)

<10-6 

UHV Version Available

No-Slit Technology

Yes 


Entrance Slit

Optional 


Grating Positioning

Motorized   Closed-loop 


Spectral Filter Insertion Unit

Yes


Control Interfaces

USB or Ethernet


Software

Windows UI and LabVIEW/VB/C/C++ SDK 


Customizable

Fully Customizable 


Options

Non-magnetic, rotated geometry, etc. 


    

Optical Indicators

Typical Value

Remarks

Product Model

beamLIGHT 60nm/21eV (XUV)

beamLIGHT 13.5nm/90eV (XUV)


Average Power Per Harmonic

Up to 400uW

Up to 0.9uW


Bandwidth Of Harmonics

<10-2

<510-3


Photon Flux Per Harmonic

Up to 1014ph/s

Up to 5 1010ph/s


Photon Flux Per Harmonic

Up to 1014ph/s

Up to 5 1010ph/s

Bandwidth Of Harmonics

<10-2

<510-3

Flux Fluctuations

<3% rms in 12 hours 


Pointing Fluctuations

<3urad rms in 12 hours 


Operating Pressure (mbar)

<10

<10-11mbar   available

Positioning

Manual or Motorized Closed-loop 


Customizable

Fully Customizable




maxLIGHT pro

NO-SLIT FLAT-FIELD XUV SPECTROMETER AND BEAM PROFILER


Our maxLIGHT spectrometer features aberration-corrected flat-field wavelength coverage from 1nm to 200nm. 

Wide-band spectral measurements are possible by three gratings covering 1-20nm, 5-80nm, and 40-200nm. 

The spectrometer can be used without entrance slit to maximize light collection for a range of source distances. 

Its modular design is able to match different experimental geometries and configurations. It features an 

integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

image.png

Features

Direct Imaging of the Source

▪ Images the source directly onto the detector, does not require a narrow entrance 

aperture

▪ ~20 times more light collection than standard versions, resulting in a signal-to-noise 

figure improved by the same ratio

▪ In some experiments, this improved signal strength is the crucial step for realizing 

a measurement at all

Rugged and Robost Design

 Compact design, small footprint

 Inherently insensitive against environmental disturbances and 

  misalignment due to omission of entrance slit

 No moving parts

 Absolute grating position monitoring for maintaining grating alignment

 Can be bolted directly to a vacuum chamber

Special Solutions

 Non-magnetic instruments

 Special housing geometries, in-chamber solutions

 EMP-protection

 UHV configurations




Capture 1.PNG

Sample measurement demonstrating the improved signal strength. 

With the same signal strength, the resolution of maxLIGHT (solid 

lines) is significantly higher compared with a standard spectrometer

(dotted lines). For equivalent resolution, standard technology would 

require a narrow slit setting and thus a significant degradation in 

signal strength. The proprietary no-slit technology delivers high 

resolution and signal strength at the same time.(data courtesy of 

Prof. C. Hauri, Paul Scherrer Inst.)

Customization

 Every spectrometer is customized to exactly match the desired 

  application,

 Interfacing to experimental chambers

 Adaption of the source distance

 Integration of customer-supplied detectors

 User-defined filter mounts


Capture.PNG

Sample measurement demonstrating the resolving power of 

maxLIGHT. The shown high harmonic spectrum is generated 

by the interaction of a single femtosecond laser pulse with a 

solid target and subsequent spectral filtering. The substructure

 inherent to the generation process is clearly resolved by the 

XUV spectrometer.Plasma Phys. Control. Fusion 53 124021 

(2011)



                                                             easyLIGHT Spectrometer

                                          Compact No-Slit Flat Field XUV Spectrometer


Our easyLIGHT spectrometer provides aberration-corrected wavelength coverage in the vacuum ultraviolet spectral 

region. Based on a normal-incidence geometry, it offers spectrograph and monochromator functionality. The high-

efficiency gratings can be rotated about their apexes by a high-accuracy positioning system, resulting in a 

wavelength selection accuracy at the exit slit of <0.1 nm. Entrance and exit slit widths can be set in the range of 0.01 

to 4 mm by micrometer screws or a motorized actuator (optional).

image.png


Direct Imaging Of The Source

▪ Flat-field spectrometer for the 30 to 250nm spectral range 

▪ No need for an alignmentsensitive narrow entrance slit 

▪~20 times more light collection than standard spectrometers, 

resulting in a proportional improvement of the signal-tonoise


Special Solutions

▪ Non-magnetic instruments

▪ UHV configurations

▪ etc

Efficiency and Accuracy

▪ Absolute grating position monitoring for maintaining grating alignment 

▪ Grating controllable by software 

▪ Highly efficient aberrationcorrected flat-field grating 

▪ Double stray-light filter 

▪ Most compact spectrometer in its range



Capture 1.PNG





Customization

▪ Every spectrometer is customized to exactly match the desired 

  application, e.g:

▪ Interfacing to experimental chambers

▪ Adaption of the source distance

▪ Integration of customer-supplied detectors

▪ User-defined filter mounts


Capture.PNG



 


                                                 beamLight Spectrometer

                                      HHG BEAMLINES and Spectrometers


Our beamLIGHT spectrometer integrates the proprietary no-slit spectrometer in a compact footprint 

(50cm length). Day-to-day operation robustness is greatly increased by this architecture as it combines 

the highest spectrometer efficiency with aberration-corrected flat-field coverage and automated beam 

bypass switching. The modular design matches a variety of experimental geometries and configurations 

as well as a standard and ultra-high vacuum version with beam diagnostics such as a beamprofiler 

or wavefront sensor which can be incorporated.

image.png


Turn-Key HHG source

▪ Reliable and stable operation for weeks without realignment 

▪ Low maintenance effort, full focus on the experiment 

▪ One-stop integrated system 

▪ Modular system design with excellent accessibility


Long-term Stable Gas Targets

▪ Durability with increased LIDT, constant gas flow for months 

▪ Accurate closed-loop positioning 

▪ Closed-loop gas flow controller 

▪ Quick exchange with solid and rotating targets

Vacuum Skim

▪ Reduced XUV re-absorption for higher signal strength 

▪ 10-4 reduction in gas load

XUV Spectral Filters

▪ Segmented foils for collinear pump/probe experiments

▪ Improved heat dissipation for high-intensity beams and stable operation for months



Capture.PNG

    nanoLIGHT Spectrometer

Integrated XUV spectrometer and beam profiler


Our nanoLIGHT spectrometer features aberration-corrected flat-field wavelength coverage from 10nm to 80nm.It incorporates spectrometer and beamprofiler that can be retracted fully for beam bypass as well as fast and automated switching between mode of operation. With its compact footprint of 16x17cm², nanoLIGHT fits in the most constricted setups and is a perfect retrofit solution. nanoLIGHT has a high grating efficiency of 20% over the full range and the adjustable sensitivity of the MCP 

detector allow for a large dynamic range.


Versatility 

▪ Two functionalities in one compact device 

▪ Fast switching between modes and transmission 

▪ Effortless integration 

▪ Integrated spectral filter insert 

▪ Integrated background light reduction

▪ Compact and cost-effective


Efficiency and Sensitivity

▪ Wide spectral coverage: 10-80nm recorded simultaneously 

▪ High overall efficiency 

▪ Large dynamic range due to MCP detection 

▪ Sensitivity adjustable, up to single photon counting regime 

▪ Low background noise

Customization

 Every spectrometer is customized to exactly match the desired 

  application,

 Interfacing to experimental chambers

 Adaption of the source distance

 Integration of customer-supplied detectors

 User-defined filter mounts


Capture 1.PNG

 General Specifications
 Optical Indicators
  Typical Value Remarks
 Product model nanoLIGHT (XUV)

 Wavelength (nm)

 10 to 80
 Resoulution 0.13 to 0.25
 Grating ~20%
 MCP ~20%
 Beam Profiler Mode -
 Resulution (um) 100



                                                                          highLIGHT Spectrometer

                                                           High-resolution Flat-field XUV Spectrometers

                                                                                                                         

Our highLIGHT spectrometer features aberration-corrected flat-field wavelength coverage from 1nm to 100nm. 

It also offers the highest spectral resolution in convenient flat-field configuration on the market. highLIGHT has 

a Resolution of 0.006nm or better combined with wide single-shot wavelength coverage and it can be used with 

or without entrance slit. Its modular design is able to match different experimental geometries and configurations. 

It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

highlight to del.png


High Spectral Resolution

▪ Flat-field spectrometer for the 1 to 100nm spectral range 

▪ Best-in-class spectral resolution combined with userfriendly flat-field configuration 

▪ Unique combination of extremely high spectral resolution, wide spectral coverage, and     an excellent signal-to-noise ratio


High Efficiency

▪ No-slit design: no need for an alignment-sensitive narrow entrance slit 

▪ ~20 times more light collection than standard spectrometers, resulting in a proportional improvement of the signal-to-noise

Accuracy and Efficiency

▪ Absolute grating position monitoring for maintaining grating alignment 

▪ Highly efficient aberrationcorrected flat-field grating 

▪ Convenient control by software




Capture.PNG

Customization

 Every spectrometer is customized to exactly match the desired 

  application,

 Interfacing to experimental chambers

 Adaption of the source distance

 Integration of customer-supplied detectors

 User-defined filter mounts

Capture 1.PNG



Slit-less Technology in Spectrometer 


Direct imaging of the source

In contrast to conventional devices the innovative XUV / VUV spectrometers by HP do not require a narrow 

entrance aperture but rather image the harmonic source directly onto the detector. Thus 80% or more of the

incoming beam can be used for measurement. This configuration typically collects 15 to 25 times more light 

than standard versions, resulting in a signal-to-noise figure improved by the same ratio. In some experiments, 

this improved signal strength is the crucial step for realizing a measurement at all.

image.png

Superior signal strength

The amount of light collected by the spectrometer is the key factor influencing its overall sensitivity and ultimately the most important feature required to obtain high 

quality data even from weak sources. Conventional spectrometers use an entrance aperture (slit) at a fixed distance from the grating to create a small source which 

is then dispersed and imaged onto the detector. In contrast to that the H+P spectrographs can be configured to directly image a radiation source positioned at any 

distance from the grating onto the detector. In practice this allows for the collection of 15 to 25 times as much light from point-like radiation sources compared to a 

conventional spectrometer with a 100µm entrance slit without degradation in spectral resolution.


Rugged design

The compact design of our XUV and VUV spectrometers makes them inherently insensitive against mechanical and environmental disturbances (vibrations, acoustics, 

etc). No moving parts on the outside and closed-loop motors with absolute position monitoring inside the instrument add to the robustness and allow for monitoring of 

the grating alignment at all times. The spectrometer can be bolted directly to a vacuum chamber and is capable of carrying its own weight. No table required. The 

design also allows mounting in virtually any orientation.


Robust against misalignment

Owing to the rugged design even smaller bumps do not influence the instruments alignment. If the instrument is knocked heavily while the motor control is enabled, the 

grating can be repositioned to the saved setting using the grating positioning motors. In addition the concept of a spectrometer without entrance slit also makes the 

instrument less sensitive to misalignment. Under typical operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer 

by 500um would lead to a signal reduction by more than 20% in an instrument with entrance slit, while it is less than 10% for our design.


Flat-field imaging technology

All our spectrometers are based on high quality aberration-corrected flat-field gratings. In contrast to conventional 

gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire 

detector in the focal plane of the grating for superior spectral resolution.

image.png



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Spectroscopy & Microscopy Solution

Check our solution page Spectroscopy Solutions | Microscopy Solutions



Search Reset
Compare Model Drawings & Specs Availability Reference Price
(USD)
easyLIGHT XUV Spectrometers
Compact No-slit Flat-field XUV Spectrometer, Wavelength coverage 100nm - 300nm Resolution <0.1nm
4-6 Weeks Request for quote
highLIGHT XUV Spectrometers
High-resolution Flat-field XUV Spectrometer, Wavelength coverage 1nm - 60nm Flat field size 90mm
4-6 Weeks Request for quote
maxLIGHT pro XUV Spectrometers
No-slit Flat-field XUV Spectrometer and Beam Profiler, Wavelength coverage 1nm - 200nm Flat field size 35-70mm
4-6 Weeks Request for quote
nanoLIGHT XUV Spectrometers
Integrated XUV spectrometer and beam profiler
4-6 Weeks Request for quote
beamLIGHT XUV Spectrometers
HHG Source Systems
4-6 Weeks Request for quote
maxCAM
industry-leading sensor, specifically designed for XUV applications, native Ethernet interface ,comprehensive software package ,compact CF63 footprint
4-6 Weeks Request for quote
easyCAM
4-6 Weeks Request for quote

easyCAM - Parameter

maxCAM - Parameter

Diameter (mm)
10

beamLIGHT XUV Spectrometers - Parameter

nanoLIGHT XUV Spectrometers - Parameter

maxLIGHT pro XUV Spectrometers - Parameter

highLIGHT XUV Spectrometers - Parameter

easyLIGHT XUV Spectrometers - Parameter

easyCAM - Download

maxCAM - Download

beamLIGHT XUV Spectrometers - Download

nanoLIGHT XUV Spectrometers - Download

maxLIGHT pro XUV Spectrometers - Download

highLIGHT XUV Spectrometers - Download

easyLIGHT XUV Spectrometers - Download

Accessories

Compare Model Drawings & Specs Availability Reference Price
(USD)