Raman Spectrometer 532/785/1064nm
Standard Spectrometer 200-1100nm
High Sensitivity UV Enhanced Spectrometer
BSI Cooled High Sensitivity Spectrometers
Large NA High QE Spectrometer 200-1450nm
Near Infrared Spectrometer 900-2500nm
More
Laser Point Scanning Confocal Microscope
Laser Line Scan Confocal Microscope
Spinning Disk Confocal Microscope
Structured Illumination Microscope
Confocal Raman Microscope
Multi-Line CW Single-Mode Laser
TCSPC System for SPAD (APD) Testing
Maskless Lithography UV Laser Writer
Laser Doppler Vibrometer 0.1Hz to 5Mhz
OCT Imaging System
NEW Product
X-ray/XRD Heating & Cryo Stage
Optical Heating & Cryo Stage
Electrical Probe Temperature Stage
Adjustable Electrical Probe Station
Tensile Strain Temperature Stage
Fiber Spectrometers (200nm to 5um)
X-Ray/XUV/VUV Spectrometers (1-300nm)
Hyperspectral Camera (220nm-4.2μm)
Multi-Spectral Camera (400-1000nm)
Spectrophotometer (240-2150nm)
Photomultiplier Tubes (PMTs)
Visible Single Photon Detector(SPD)
Infrared Single Photon Detector(SPD)
Photodiode PD (200nm-12um)
Pyroelectric Infrared Detectors (2-12um)
Single Photon Avalanche Diode Detector Array
IR Beam Profiler (2-16um)
Terahertz Beam Profiler(1-18 THz)
Scanning Slit Beam Profiler (190-2500nm)
Photodiode Power Sensors 250-2500nm
Power Meter Console
Integrating Spheres (10mm-100mm)
Power Meter Adaptor & Accessories
1/8m Monochromator/Spectrograph
1/2m&1/4m Monochromator/Spectrograph
Monochromator Accessories
Filter & Wheel
LIV Test Systems for Laser Diode / LED
White Light Interferometer
Optical Coating CRD Reflectrometer
Optical Test Measurement System
RF Test Measurement System
CW Pigtail Laser Diode (400-1920nm)
CW Laser Diode Module (375-785nm)
CW Multi Wavelength Laser
DPSS Nanosecond Pulsed Lasers
DFB/FP Picosecond Laser (370-1550nm)
High-Power Femtosecond Solid-State Lasers
Nanosecond Pulse Fiber Laser(1064-2um)
Picosecond Pulse Fiber Laser (515nm - 2um)
Femtosecond Pulse Fiber Laser 780nm-2um
CW Fiber Laser System (405nm - 2um)
CW Narrow Linewidth Lasers (1530nm-2um)
C-Band Tunable Laser (1529 -1567nm)
L-Band Tunable Laser (1554 -1607nm)
Supercontinuum Fiber Lasers 450-2300nm
Femtosecond OPA (650 - 2600nm)
Short-pulse OPA (650 - 2600nm)
Broadband Femtosecond Laser 950-1150nm
Erbium Doped Fiber Amplifier
Ytterbium Doped Fiber Amplifier
Thulium-Doped Fiber Amplifier
Fiber Raman Amplifier
Semiconductor Optical Amplifier (SOA)
Microscope Light & Lamp (185 - 5500nm)
Single Wavelength LED Source(240-980nm)
Multi-wavelength LEDs Source (240-980nm)
ASE Light Sources (830-2000nm)
IR Emitter Chip (2-14um)
Light Field Sythesizer
Hollow-Core Fiber Compressor
High Powered Hollow-Core Fiber Compressor
Ultra-High Contrast 3rd-Order Autocorrelator
Coherent Ultrabroadband XUV Light Source
Enhanced Cavities for Laser Light
Terahertz Quantum Cascade Lasers(1-4.5Thz)
CW IR Quantum Cascade Lasers(3-12μm)
CW LWIR Quantum Cascade Lasers (10-17um)
Auto-Fluorescence Microscope
Wideband Handheld Confocal Raman Skin Analyzer
Fluorescence Upright / Inverted Microscope
Biological Upright / Inverted Microscope
Phase Contrast Microscope
Dark Field Microscope
Polarizing Microscope
Metallographic Upright / Inverted Microscope
Smart 3D Stereo Microscope
USB Digital Microscope With Platform
Built-in Digital Microscope
Plan Apochromatic Objective
Industrial Plan Objective
Biology Plan Objective
Microscope CCD Camera (VIS-NIR)
Microscope CMOS Camera (UV-NIR)
UV & NIR Enhanced CMOS Camera
Hyperspectral Camera for Microscope
Multispectral Camera For Microscope
Microscope Light & Lamp
Soft X-Ray BSI sCMOS Camera (80-1000eV)
UV-NIR sCMOS Camera (200-1100nm)
Intensified CMOS Camera (200-1100nm)
Imaging Intensifier Tube
Full Frame CCD Camera for UV VIS NIR
Full Frame CCD Camera for VUV EUV X-ray
Full Frame In-vacuum CCD Cameras
Large Format In-vacuum CCD Cameras
HDMI Color CMOS Camera (Monitor)
High Speed Line Scan Camera
Large Format Camera
High Speed Large Format Camera
Frame Grabber
Infrared Pyrometers (-40-3000C)
Infrared linear Array Camera
Infrared Matrix Array Cameras
Blackbody Calibration Sources -15 to 1500°C
Short-Wave Infrared Camera (SWIR)
Mid-Wave Infrared Camera (MWIR)
Long-Wave Infrared Camera (LWIR)
Hyperspectral Camera LineScan (0.22-4.2um)
Hyperspectral Camera SnapShot(0.35-1um)
Optical Coherence Tomography (OCT)
Free Space Acousto-Optic Modulators (AOM)
Fiber Coupled Acousto-Optic Modulators
Acousto-Optic Tunable Filter (AOTF)
Acousto-Optic Q-switch (AOQ)
Acousto-Optic Frequency Shift (AOFS)
Phase Modulators
Electro-optical amplitude modulator
Electro-optic phase modulator
Ultra-fast Pulse Generator for TCSPC
Multi-Channel Single Photon Counting Device
ID1000 Timing Controller
Photodetectors
Phase Modulator
Amplitude Modulator
Education Kits
Pulsed Voltage
Pulsed Current
General Purpose Pulse Generators
Medium and High Voltage Pulse Generators
High Speed Impulse Generator
Very High Speed Pulse Generators
Function Generators
Pulse Amplifiers
TPX / HDPE Terahertz Plano Convex Lens
Off-Axis Parabolic Mirrors
Terahertz Hollow Retro Reflector
Terahertz Metallic Mirrors
ZnTe / GaSe Terahertz Crystals
Terahertz Beam Expander Reflection
Waveplates
Optical Isolator
Optical Polarizers
Beamsplitter Plate
Beamsplitter Cube
Dichroic Beamsplitters
Ultrathin Beamsplitter Plate
Bandpass Filters Fluorescence Microscope
Filters for Raman Spectroscopy
Narrow Filters for Laser
Filters for FISH
Filters for TIRF Microscope
Filters for FRET Microscope
Laser Crystals
Nonlinear Optical Crystals
Birefringent Crystals
Optical Crystals
Electro-optical Crystals
Micro-Channel Plate (MCP)
Micro-Channel Plate Assembly (MCP)
Fiber Optic Plates (FOP)
Micro Pore Optics
X-Ray Collimators
Hybrid Fiber Components
Optical Circulator
Filter Coupler
In-line Polarizer/PBC/PBS
WDM/DWDM/CWDM/Bandpass Filter
FA Lens
Zoom Lens
Telecentric Lens Series
In-situ Tensile Heating & Cryo Stage
Lens Mounts
Mirror Mounts
Filter Mounts
13mm Linear Stages
25mm Linear Stages
Rotation and Tilt Stages
Rack and Pinion Stages
Vertical Axis Stages
2-Axis Stages
Solid Vibration Isolation Optical Table
Solid Vibration Isolation Table
Pneumatic Optical table
Pneumatic Optical Table With Pendulum Rod
Honeycomb Optical Breadboard
Single Axis Motorized Piezo Stage
XY Motorized Piezo Stages
Multi Axis Motorized Piezo Stages
XY Microscope Piezo Stages
Vacuum Non-magnetic Piezo Stage
Nano Electric Actuator
Key Product Features
Reflectivity measurements up to 99.9995%
Various angles of incidence: 5°-45° (and 0°)
S and p polarization (separately)
Antireflective coating characterization down to 0.0005% (5 ppm)
Simple and reproducible alignment for 0.5”, 1” and 2” optics
High-speed data acquisition and real-time analysis
Wavelengths in the range 375-1550 nm available
Model GLACIER
Cavity-Ringdown (CRD) Loss Meter and Reflectometer
Our reflectometer GLACIER uses the extreme sensitivity of cavity ring-down spectroscopy to quantify the losses of advanced optical coatings down to 5 ppm. As a typical application the device can characterize supra-mirrors with up to 99.9995 % reflectivity. Conventional absorption and reflection measurements are not sufficiently sensitive to quantify today´s super-reflective mirror coatings and are typically limited to the > 1000 ppm range (corresponding to < 99.9 % reflectivity). Cavity ring-down spectroscopy measures optical losses by the decay of the energy stored inside a cavity.
The technique reaches unrivalled sensitivity, because losses are experienced with each round trip inside the cavity over and over again. Smaller losses lead to longer intra-cavity dwell time thereby automatically increasing measurement precision. The device features high-speed data acquisition and allows to record measurements within seconds. It is delivered complete with a computer and a user-friendly software interface for acquisition and real-time analysis.
Model GLACIER-123
1064nm Harmonics Reflectometer and Loss Meter
GLACIER®-123 designed as a multi-wavelength system, it is the first of its kind to measure at 355 nm. It includes a microchip laser that emits 1064, 532 and 355 nm radiation, making it particularly interesting for those in need of these harmonic wavelengths.Our reflectometers use the extreme sensitivity of cavity ringdown spectroscopy to quantify the losses of advanced optical coatings down to 5 ppm. As a typical application, the device can characterize supra-mirrors with up to 99.9995% reflectivity. Conventional absorption and reflection measurements are not sufficiently sensitive to quantify today's super-reflective mirror coatings and are typically limited to the >1000 ppm range (corresponding to <99.9% reflectivity). Cavity ring-down spectroscopy measures optical losses by the decay of the energy stored inside a cavity.
The technique reaches unrivalled sensitivity because the losses are experienced over and over again after every round trip inside the cavity. Lower losses lead to longer intra-cavity dwell time thereby automatically increasing the measurement precision. The device features high-speed data acquisition and allows to record measurements within seconds. It is delivered complete with a computer and a user-friendly software interface for acquisition and real-time analysis.
Model GLACIER-C
Supercotinuum light source Cavity-Ringdown Reflectometer
GLACIER®-C is a further development of our successful reflectometer. it allows measuring the losses of optical coatings down to 5 ppm using the extremly sensitive cavity ring-down spectroscopy method. It is therefore often used to characterize highly reflective mirrors where conventional reflection and absorption measurements are insufficient. The innovation of GLACIER®-C is the employment of a super- continuum laser source in combination with a tunable monochromator. This allows a freely selectable wavelength within 450 nm and 2000 nm and, thus, offers an unprecedented flexibility as it is not limited to available diode laser wavelengths. GLACIER®-C combines the unrivalled sensitivity of GLACIER® with a unique wavelength flexibility, creating the most powerful device on the market. The device features high-speed data acquisition and allows to record measurements within seconds. Easy and fast change of wavelength is facilitated through the user friendly software and easy change of optics on kinematic mounts.
Specification Guide
375 — 1550 nm (diode laser based)
GLACIER
Working Principle
Glacier uses the principle of reflectivity/loss measurements with cavity ring-down spectroscopy based on very low losses at each mirror bounce.
The laser pulses travel inside a cavity experiencing optical losses over and over again during each round trip.
Sketch of the working principle of GLACIER, measurement and fitting procedure
Sample Measurement
The device measures the time-dependent intensity I(t) leaked through an end mirror
of the cavity (center).
The signal decays with a time constant depending on the intra-cavity losses and can
be fitted to the following exponential function:
The time constant τ is inversely proportional to the optical losses (1-R) of the cavity
withtotal reflectivity R:
where n is the refractive index, c is the speed of light, and l is the cavity length
Typical GLACIER measurement of an ultrahigh-reflective mirror for 1030 nm.
To obtain the data, the cavity losses with and without the sample were
measured and subtracted. This provides an absolute measurement
of the test mirror
We are here for you!
Don't have time to search the products one by one? No worries. you can download the full range of SIMTRUM Product Line Cards.
Click it now.
Want to stay closer to the Market Dynamics and Technological Developments? Just take 5 seconds to Sign In as a member of SIMTRUM, we will bring you the most up-to-date news.
(Sign in button on the top right of the screen).
Company
Light Analysis
Microscope
Light Sources
Imaging
Optics