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X-ray Spectrometer (1-20keV) | SIMTRUM Photonics Store

X-ray Spectrometer (1- 20keV)

hardLIGHT X-ray Spectrometer (2 - 4keV)

The TXS spectrometer enables accurate photon diagnostics at HHG beamlines, X-ray 

free-electron lasers, and table-top X-ray lasers. Photon energies between 2 keV and 

4 keV can be measured in single-shot. In von Hamos geometry with high-efficiency 

backscattering, the X-ray spectrum is fingerprinted for online beam characterization. 

The transmitted beam remains undisturbed with >90% transmission for further use in 

experiments. By simply exchanging the backscattering probe with a material sample, 

the hardLIGHT TXS is made ready for X-ray emission spectroscopy (XES). The tender 

X-ray range provides sensitive access to the chemical state of many materials, e.g., 

investigations of sulfur at 2keV allow for important insights for battery research.

X-ray Spectrometer.JPG

Please check the table below for individual specifications

Product Brochure English: X-ray Spectrometer (1-20keV)

中文产品册: X-ray Spectrometer (1-20keV)


Typical Value

Remarks

Product Model

hardLIGHT TXS


Topology

Von Hamos


Energy Range (KeV)

2-4 keV , resolution 0.3eV


Source Distance

Flexible


Detector

CCD or MCP/CMOS or Hybrid


Operating Pressure (mbar)

< 10-6

UHV Version Available

Crystal Positioning

Motorized Closed-loop


Spectral Filter Insertion Unit

Optional


Control Interfaces

USB or Ethernet


Software

Windows UI and LabVIEW/VB/C/C++SDK


Customizable

Fully Customizable



Versatility

• Small footprint

• Easily transferred between experimental stations

• Intuitive operation


XES Operation Mode

• Emission spectroscopy in the tender X-ray range 2-4keV

• Integrated sample mount

• High energy resolution of 10-4 in a bandwidth of 2%


Diagnostic Operation Mode

• Online beam characterization at HHG beamlines, 

• X-ray free-electron lasers, 

• table-top X-ray lasers

• Non-interfering architecture with backscattering probe

• High transmission >90%





box.JPG

Customization

• Every spectrometer is customized to exactly match the desired 

  application, e.g:

• Table-top x-ray spectrometers

• Bragg/Laue x-ray spectrometer

• Combined crystal/multilayer spectrometer

• Tokamak diagnostics

• Monte Carlo simulations


hardlight.JPG



Related UV Camera Options



maxCAM

easyCAM
 Sensor

 back-illuminated CCD from e2v (grade 1),

 enhanced process, uncoated

front-illuminated CCD from e2v (grade 1), 

enhanced process

Wavelength1-100nm( Best QE)50-300nm
 Pixels 1024 x 255 *
 Pixel size 26 x 26 um
 Image area 26.7 x 6.7 mm
 Spectral rates 200/s full vertical bin, 1000/s crop mode
 Minimum temperature -60° C air cooled
 Well depth

 500 000 e- active area,  1 000 000 eregister

 Read noise 12.5 etyp. at 500kHz
 Dark current 0.004 e- /px/s at -60°C
 Linearity >99%
 Vacuum compatibility 10-8mbar

Related Spectrometer Product 

Product ModelWavelength (nm)DispersionResolution  
maxLIGHT Pro (XUV)5 to 800.5 to   1.3nm/mm<0.028nm at 40nm
easyLIGHT (XUV)30 to 250~2.0nm/mm<0.1nm
highLIGHT(XUV)1 to 100-<0.1nm
maxLIGHT (VUV)40 to 2000.9 to   1.6nm/mm<0.05nm at 120nm
easyLIGHT (VUV)80 to  300~2.5nm/mm<0.1nm
X-Ray Spectroscopy 
2-4 keV
0.3eV
Extended X-ray Spectroscopy5-12keV

Near Edge X-ray absorption 
200 - 1200eV



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