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Extended X-ray Absorption EXAFS (5-12keV) | SIMTRUM Photonics Store

Extended X-ray Absorption EXAFS (5-12keV)

INTEGRATED XAFS SOLUTION

A complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray 

Absorption Near Edge Structure (XANES) measurements.

In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid 

detector together with a software suite to control instrument functions and analyze data. Spectra 

quality is on par with synchrotron measurements hence beamtime application is not required.

The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K 

absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the 

spectrometer yields an extremely high signal-to-noise ratio.This results in the analyte 

concentration being weighted lowly at few percentage.The instrument combines high efficiency 

with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered 

absorption edges.

image.jpg


Features

Table-top XAFS system

Synchrotron-quality spectra

Applications

 First integrated lab-based EXAFS and XANES solution

 Beamtime does not require appliction

 Fast polychromatic acquisition

 Energy range 5 to 12keV

 High resolving power of 4000

 Wide bandpass of up to 1keV

 Chemical state analysis for geology, biology, materials research

 Information on atomic distances, oxidation state, coordination 

    number 

 Analysis of K-absorption edges of 3d-transition metals

Element Range

 Range of elements accessible to  hiXAS for EXAFS and XANES 

    measurements. 

 Even diluted samples with analyte concentrations of only a few 

    weight percent can be measured in a time frame of several

    minutes.


image.JPG


Image.jpg

 Sample XAFS measurement of a 10um Cu foil, comparing lab-based (red) 

     and synchrotron (black) results.

 EXAFS oscillations (left) and corresponding Fourier transformation (right).

 Acquisition time: 3min with sample, 1.5min without sample.

 X-ray absorption spectrum of a 6um-thick Ni foil. Comparison 

    to the spectrum.

 Obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000)

 Shows the high quality results of the tabletop instrument.

 All relevant spectral features are present, allowing for the 

   determination of chemical compounds

 Application

  Chemical speciation and concentration ratios

  Compound research

  Short range order and bond length determination

  Catalyst analysis



Please check the table below for individual specifications

Product Brochure English: Extended X-ray Absorption Fine Structure
   Specifications
   Topology   X-ray tube source von Hamos HAPG spectrometer hybrid detector
   Energy range   5-12keV
   Analyte concentration   Own to a few wt%
   Sample mount   Turret mount for multiple samples
   Footprint   2.0m x 1.0m
   Software suite   Integrated system control, variety of spectra calibration and analysis functions



   EXAFS mode   XANES mode
   Resolving power   1800   4000
   Energy bandpass   1000eV   300eV
   Acquisition time   3min   8min





Related UV Camera Options



maxCAM

easyCAM
 Sensor

 back-illuminated CCD from e2v (grade 1),

 enhanced process, uncoated

front-illuminated CCD from e2v (grade 1), 

enhanced process

Wavelength1-100nm( Best QE)50-300nm
 Pixels 1024 x 255 *
 Pixel size 26 x 26 um
 Image area 26.7 x 6.7 mm
 Spectral rates 200/s full vertical bin, 1000/s crop mode
 Minimum temperature -60° C air cooled
 Well depth

 500 000 e- active area,  1 000 000 eregister

 Read noise 12.5 etyp. at 500kHz
 Dark current 0.004 e- /px/s at -60°C
 Linearity >99%
 Vacuum compatibility 10-8mbar

Related Spectrometer Product 

Product ModelWavelength (nm)DispersionResolution  
maxLIGHT Pro (XUV)5 to 800.5 to   1.3nm/mm<0.028nm at 40nm
easyLIGHT (XUV)30 to 250~2.0nm/mm<0.1nm
highLIGHT(XUV)1 to 100-<0.1nm
maxLIGHT (VUV)40 to 2000.9 to   1.6nm/mm<0.05nm at 120nm
easyLIGHT (VUV)80 to  300~2.5nm/mm<0.1nm
X-Ray Spectroscopy 
2-4 keV
0.3eV
Extended X-ray Spectroscopy5-12keV

Near Edge X-ray absorption 
200 - 1200eV



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