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Products / Light Analysis /Spectrometers /X-Ray/XUV/VUV Spectrometers (1-300nm) /XUV Spectrometers (1-200nm) /

XUV Spectrometers (1-200nm)

Specification maxLIGHT easyLIGHT beamLIGHT Related Product Quotation

XUV Spectrometer Specification Comparison

Brochures English: maxLIGHT pro | easyLIGHT | beamLIGHT | nanoLIGHT | highLIGHT

产品册中文： maxLIGHT pro | easyLIGHT | beamLIGHT | nanoLIGHT | highLIGHT

Optical Indicators	Typical Value			Remarks
Product Model	maxLIGHT Pro (XUV)	easyLIGHT (XUV)	highLIGHT(XUV)
Wavelength (nm)	5 to 80	30 to 250	1 to 100
Dispersion	0.5 to 1.3nm/mm	~2.0nm/mm	-
Resolution	<0.028nm at 40nm	<0.1nm	-
Flat-field Size	-	75mm	-
Deviation Angle	-	94°	-
Source Distance	Flexible
Detector	CCD or MCP/CMOS
Operating Pressure (mbar)	<10^-6			UHV Version Available
No-Slit Technology	Yes
Entrance Slit	Optional
Grating Positioning	Motorized Closed-loop
Spectral Filter Insertion Unit	Yes
Control Interfaces	USB or Ethernet
Software	Windows UI and LabVIEW/VB/C/C++ SDK
Customizable	Fully Customizable
Options	Non-magnetic, rotated geometry, etc.

Optical Indicators	Typical Value		Remarks
Product Model	beamLIGHT 60nm/21eV (XUV)	beamLIGHT 13.5nm/90eV (XUV)
Average Power Per Harmonic	Up to 400uW	Up to 0.9uW
Bandwidth Of Harmonics	<10^-2	<5 •10^-3
Photon Flux Per Harmonic	Up to 10¹⁴ph/s	Up to 5 • 10¹⁰ph/s
Photon Flux Per Harmonic	Up to 10¹⁴ph/s		Up to 5 • 10¹⁰ph/s
Bandwidth Of Harmonics	<10^-2		<5 •10^-3
Flux Fluctuations	<3% rms in 12 hours
Pointing Fluctuations	<3urad rms in 12 hours
Operating Pressure (mbar)	<10		<10^-11mbar available
Positioning	Manual or Motorized Closed-loop
Customizable	Fully Customizable

Slit-less Technology in Spectrometer

Direct imaging of the source

In contrast to conventional devices the innovative XUV / VUV spectrometers by HP do not require a narrow

entrance aperture but rather image the harmonic source directly onto the detector. Thus 80% or more of the

incoming beam can be used for measurement. This configuration typically collects 15 to 25 times more light

than standard versions, resulting in a signal-to-noise figure improved by the same ratio. In some experiments,

this improved signal strength is the crucial step for realizing a measurement at all.

Superior signal strength

The amount of light collected by the spectrometer is the key factor influencing its overall sensitivity and ultimately the most important feature required to obtain high

quality data even from weak sources. Conventional spectrometers use an entrance aperture (slit) at a fixed distance from the grating to create a small source which

is then dispersed and imaged onto the detector. In contrast to that the H+P spectrographs can be configured to directly image a radiation source positioned at any

distance from the grating onto the detector. In practice this allows for the collection of 15 to 25 times as much light from point-like radiation sources compared to a

conventional spectrometer with a 100µm entrance slit without degradation in spectral resolution.

Rugged design

The compact design of our XUV and VUV spectrometers makes them inherently insensitive against mechanical and environmental disturbances (vibrations, acoustics,

etc). No moving parts on the outside and closed-loop motors with absolute position monitoring inside the instrument add to the robustness and allow for monitoring of

the grating alignment at all times. The spectrometer can be bolted directly to a vacuum chamber and is capable of carrying its own weight. No table required. The

design also allows mounting in virtually any orientation.

Robust against misalignment

Owing to the rugged design even smaller bumps do not influence the instruments alignment. If the instrument is knocked heavily while the motor control is enabled, the

grating can be repositioned to the saved setting using the grating positioning motors. In addition the concept of a spectrometer without entrance slit also makes the

instrument less sensitive to misalignment. Under typical operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer

by 500um would lead to a signal reduction by more than 20% in an instrument with entrance slit, while it is less than 10% for our design.

Flat-field imaging technology

All our spectrometers are based on high quality aberration-corrected flat-field gratings. In contrast to conventional

gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire

detector in the focal plane of the grating for superior spectral resolution.

maxLIGHT pro

NO-SLIT FLAT-FIELD XUV SPECTROMETER AND BEAM PROFILER

Our maxLIGHT spectrometer features aberration-corrected flat-field wavelength coverage from 1nm to 200nm.

Wide-band spectral measurements are possible by three gratings covering 1-20nm, 5-80nm, and 40-200nm.

The spectrometer can be used without entrance slit to maximize light collection for a range of source distances.

Its modular design is able to match different experimental geometries and configurations. It features an

integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

Features

Direct Imaging of the Source

▪ Images the source directly onto the detector, does not require a narrow entrance

aperture

▪ ~20 times more light collection than standard versions, resulting in a signal-to-noise

figure improved by the same ratio

▪ In some experiments, this improved signal strength is the crucial step for realizing

a measurement at all

Rugged and Robost Design

▪ Compact design, small footprint

▪ Inherently insensitive against environmental disturbances and

misalignment due to omission of entrance slit

▪ No moving parts

▪ Absolute grating position monitoring for maintaining grating alignment

▪ Can be bolted directly to a vacuum chamber

Special Solutions

▪ Non-magnetic instruments

▪ Special housing geometries, in-chamber solutions

▪ EMP-protection

▪ UHV configurations

Capture 1.PNG

Sample measurement demonstrating the improved signal strength.

With the same signal strength, the resolution of maxLIGHT (solid

lines) is significantly higher compared with a standard spectrometer

(dotted lines). For equivalent resolution, standard technology would

require a narrow slit setting and thus a significant degradation in

signal strength. The proprietary no-slit technology delivers high

resolution and signal strength at the same time.(data courtesy of

Prof. C. Hauri, Paul Scherrer Inst.)

Customization

▪ Every spectrometer is customized to exactly match the desired

application,

▪ Interfacing to experimental chambers

▪ Adaption of the source distance

▪ Integration of customer-supplied detectors

▪ User-defined filter mounts

Sample measurement demonstrating the resolving power of

maxLIGHT. The shown high harmonic spectrum is generated

by the interaction of a single femtosecond laser pulse with a

solid target and subsequent spectral filtering. The substructure

inherent to the generation process is clearly resolved by the

XUV spectrometer.Plasma Phys. Control. Fusion 53 124021

(2011)

easyLIGHT Spectrometer

Compact No-Slit Flat Field XUV Spectrometer

Our easyLIGHT spectrometer provides aberration-corrected wavelength coverage in the vacuum ultraviolet spectral

region. Based on a normal-incidence geometry, it offers spectrograph and monochromator functionality. The high-

efficiency gratings can be rotated about their apexes by a high-accuracy positioning system, resulting in a

wavelength selection accuracy at the exit slit of <0.1 nm. Entrance and exit slit widths can be set in the range of 0.01

to 4 mm by micrometer screws or a motorized actuator (optional).

Direct Imaging Of The Source

▪ Flat-field spectrometer for the 30 to 250nm spectral range

▪ No need for an alignmentsensitive narrow entrance slit

▪~20 times more light collection than standard spectrometers,

resulting in a proportional improvement of the signal-tonoise

Special Solutions

▪ Non-magnetic instruments

▪ UHV configurations

▪ etc

Efficiency and Accuracy

▪ Absolute grating position monitoring for maintaining grating alignment

▪ Grating controllable by software

▪ Highly efficient aberrationcorrected flat-field grating

▪ Double stray-light filter

▪ Most compact spectrometer in its range

Capture 1.PNG

Customization

▪ Every spectrometer is customized to exactly match the desired

application, e.g:

▪ Interfacing to experimental chambers

▪ Adaption of the source distance

▪ Integration of customer-supplied detectors

▪ User-defined filter mounts

beamLight Spectrometer

HHG BEAMLINES and Spectrometers

Our beamLIGHT spectrometer integrates the proprietary no-slit spectrometer in a compact footprint

(50cm length). Day-to-day operation robustness is greatly increased by this architecture as it combines

the highest spectrometer efficiency with aberration-corrected flat-field coverage and automated beam

bypass switching. The modular design matches a variety of experimental geometries and configurations

as well as a standard and ultra-high vacuum version with beam diagnostics such as a beamprofiler

or wavefront sensor which can be incorporated.

Turn-Key HHG source

▪ Reliable and stable operation for weeks without realignment

▪ Low maintenance effort, full focus on the experiment

▪ One-stop integrated system

▪ Modular system design with excellent accessibility

Long-term Stable Gas Targets

▪ Durability with increased LIDT, constant gas flow for months

▪ Accurate closed-loop positioning

▪ Closed-loop gas flow controller

▪ Quick exchange with solid and rotating targets

Vacuum Skim

▪ Reduced XUV re-absorption for higher signal strength

▪ 10^-4 reduction in gas load

XUV Spectral Filters

▪ Segmented foils for collinear pump/probe experiments

▪ Improved heat dissipation for high-intensity beams and stable operation for months

highLIGHT Spectrometer

High-resolution Flat-field XUV Spectrometers

Our highLIGHT spectrometer features aberration-corrected flat-field wavelength coverage from 1nm to 100nm.

It also offers the highest spectral resolution in convenient flat-field configuration on the market. highLIGHT has

a Resolution of 0.006nm or better combined with wide single-shot wavelength coverage and it can be used with

or without entrance slit. Its modular design is able to match different experimental geometries and configurations.

It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

High Spectral Resolution

▪ Flat-field spectrometer for the 1 to 100nm spectral range

▪ Best-in-class spectral resolution combined with userfriendly flat-field configuration

▪ Unique combination of extremely high spectral resolution, wide spectral coverage, and an excellent signal-to-noise ratio

High Efficiency

▪ No-slit design: no need for an alignment-sensitive narrow entrance slit

▪ ~20 times more light collection than standard spectrometers, resulting in a proportional improvement of the signal-to-noise

Accuracy and Efficiency

▪ Absolute grating position monitoring for maintaining grating alignment

▪ Highly efficient aberrationcorrected flat-field grating

▪ Convenient control by software

Customization

• Every spectrometer is customized to exactly match the desired

application,

• Interfacing to experimental chambers

• Adaption of the source distance

• Integration of customer-supplied detectors

• User-defined filter mounts

Capture 1.PNG

Related UV Camera Options


	maxCAM	easyCAM
Sensor	back-illuminated CCD from e2v (grade 1), enhanced process, uncoated	front-illuminated CCD from e2v (grade 1), enhanced process
Wavelength	1-100nm( Best QE)	50-300nm
Pixels	1024 x 255 *
Pixel size	26 x 26 um
Image area	26.7 x 6.7 mm
Spectral rates	200/s full vertical bin, 1000/s crop mode
Minimum temperature	-60° C air cooled
Well depth	500 000 e- active area, 1 000 000 eregister
Read noise	12.5 etyp. at 500kHz
Dark current	0.004 e- /px/s at -60°C
Linearity	>99%
Vacuum compatibility	10-8mbar

Related Spectrometer Product

Product Model	Wavelength (nm)	Dispersion	Resolution
maxLIGHT Pro (XUV)	5 to 80	0.5 to 1.3nm/mm	<0.028nm at 40nm
easyLIGHT (XUV)	30 to 250	~2.0nm/mm	<0.1nm
highLIGHT(XUV)	1 to 100	-	<0.1nm
maxLIGHT (VUV)	40 to 200	0.9 to 1.6nm/mm	<0.05nm at 120nm
easyLIGHT (VUV)	80 to 300	~2.5nm/mm	<0.1nm
X-Ray Spectroscopy	2-4 keV		0.3eV
Extended X-ray Spectroscopy	5-12keV
Near Edge X-ray absorption	200 - 1200eV

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Spectroscopy & Microscopy Solution

Check our solution page Spectroscopy Solutions | Microscopy Solutions

Search Reset

	Availability	Reference Price (USD)
easyLIGHT XUV Spectrometers Compact No-slit Flat-field XUV Spectrometer, Wavelength coverage 100nm - 300nm Resolution <0.1nm	4-6 Weeks	Request for quote
highLIGHT XUV Spectrometers High-resolution Flat-field XUV Spectrometer, Wavelength coverage 1nm - 60nm Flat field size 90mm	4-6 Weeks	Request for quote
maxLIGHT pro XUV Spectrometers No-slit Flat-field XUV Spectrometer and Beam Profiler, Wavelength coverage 1nm - 200nm Flat field size 35-70mm	4-6 Weeks	Request for quote
nanoLIGHT XUV Spectrometers Integrated XUV spectrometer and beam profiler	4-6 Weeks	Request for quote
beamLIGHT XUV Spectrometers HHG Source Systems	4-6 Weeks	Request for quote
maxCAM industry-leading sensor, specifically designed for XUV applications, native Ethernet interface ,comprehensive software package ,compact CF63 footprint	4-6 Weeks	Request for quote
easyCAM	4-6 Weeks	Request for quote