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Silicon APD Detection Module | SIMTRUM Photonics Store

Products / Light Analysis /Photodetectors /Visible Single Photon Detector(SPD) /Silicon APD Detection Module /
Silicon APD Detection Module
Overview Specifications Related Product Order Now!

Silicon APD Detection Module-ST-APD

Our photon counting module ST-APD  is an ultra-sensitive photon counting module based on Si-APD electric detector. The detection band covers 200 -1060 nm, ST-APD can work in linear mode and geiger mode and the gain is over 60 dB in geiger mode. The unique high-performance active suppression circuit of ST-APD can realize continuous single-photon detection, and can be loaded with detection gates of arbitrary width and period. The circuit achieves avalanche suppression greater than 20 dB , maximizing the performance state of the ST-APD.The detection efficiency at 700 nm band exceeds 60%, with dark count 200-500 cps and dead time less than 50ns.


The effective photosensitive detection area of ST-APD standard model can reach up to 500 um, The single photon counting signal is converted into a digital TTL signal inside the module and sent out through the SMA interface. Highly integrated modular design facilitates OEM application and industrial integration. 

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ST-APD works at as low as -20℃ low temperature environment through internal cooling module to achieve the best signal-to-noise ratio. The refrigeration module is controlled by a highly efficient TEC and the control accuracy can reach ±0.2℃.




Feature

Application

-High detection efficiency: 65%@700 nm

-500 um photosensitive area

-LVTTL digital signal output

-Low dark count

-Low afterpulse

-Low timing jitter



-Fluorescence measurement

-Laser ranging

-Quantum communication

-Quantum optics

--Spectral measurement

-Photon correlation

-Adaptive optics



Spectral Response

0f6115b61b0505c7621f7da0c7b9f401_Spectral_Data.jpg



Terms of Use

1.Incorrect voltage may damage the module, please ensure that the power supply is connected correctly.


2.APD is a high-sensitivity photodetection device. In the avalanche state, the intensity of the input light signal should be controlled. Excessive light intensity may damage the APD, which may reduce the detection sensitivity of the APD, and even cause diode breakdown in severe cases.


3.In special application scenarios, it should be ensured that the operating temperature of the module does not exceed 50 ℃. Excessive temperature may cause a temperature increase in APD operating temperature, which causes dark count levels to increase.


4.The default dead time of ST-APD is 50ns . The dead time setting will affect the maximum count rate of the module. When the dead time is set at 50ns, the standard value of the count rate is 10Mcps. If your application has special requirements for the dead time setting, please contact us when ordering Click Here.


5.Similarly, the pulse width of the output signal will also affect the maximum count rate, the typical pulse width is 30ns, if your application has special requirements on the output signal, please contact us when ordering Click Here.


6.ST-APD supports space and optical fiber interface access.



Product specifications and Brochures

Product Brochure Link: 

ParameterMinimum ValueTypical ValueMaximum ValueUnit
Supply Voltage/12/V
Supply Current/0.5/A
Spectral Response Range200/1060nm
Detection Efficiency/@200nm：2
@700nm：65
@850nm：45
@1060nm：3		/%
Dark Count200/500cps
Dead Time/50/ns
Afterpulse358%
Saturation Count Rate/1015Mcps
Photosensitive Area/500/μm
APD Refrigeration Temperature/-20/℃
Operating Temperature-15/50℃
Output Signal Level Standard/LVTTL//
Output Signal Pulse Width530/ns
Gate Pulse Input Level
(Disable = LVTTL Low)		0/0.4V
Gate Pulse Input Level
(Enable = LVTTL High)		2/3.3V
Gate Pulse Frequency//5000kHz
Power Consumption/58W

Note:

1.5V voltage input can be customized

2.The given saturation count rate is the result of the default setting , changing the output pulse width or dead time will change the saturation count rate.



Visible Single Photon Detector(SPD)

Model Wavelength Range Timing Resolution QE  Dark Count Rate
Silicon APD Detection Module
 200 -1060nm   65%@700nm，2%@200nm <200cps to <500cps
Visible SPD (Peak QE~500nm) 350 - 1000nm <40ps 35%@500nm, 25%@600nm <7Hz  to <250Hz
Visible SPD (Peak QE~800nm) 350 - 1000nm <200ps
 60%@640nm, 80%@800nm <300Hz to <1000Hz
Visible Photon Counter OEM
 350 - 900nm 40 -60ps 35%@500nm，4%@900nm <30Hz to <300Hz

 

Timing Tagging Devices

Ultra-fast Pulse Generator for TCSPC
Time-Correlated Single-Photon Counting System
ID1000 Timing Controller




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ST-APD
Silicon APD Detection Module, Spectral Response Range 200nm-1060nm, Detection Efficiency @200nm 2%, @700nm 65%, @850nm 45%, @1060nm 3%, Dark Count 200cps-500cps, Dead Time 50ns, Photosensitive Area 500μm, APD Refrigeration Temperature-20℃, Output Signal Level Standard LVTTL 		6-8 weeks Request for quote

ST-APD - Parameter

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