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FTIR OEM Module | SIMTRUM Photonics Store

FTIR OEM Module
SIMTRUM'S OEM010 module is our most compact FT-IR complete system. It features a built-in SiC globar heated to 1550 °K and regulated in temperature to ensure stable illumination. The light that is being output by the instrument is first modulated by our permanently aligned interferometer, making it robust against stray light that might eventually reach the detector. The OEM010 rugged casing also holds a highly sensitive TE-MCT detector which maximizes the response of the system.

 

Features

  • Customizable I/O interfaces
  • Dynamically adjustable resolution:8/4/2 cm⁻¹, 0.5 cm⁻¹(on request)
  • Wear free moving parts for extended lifetime
  • Ethernet interface with embedded processing available
 
Product Specifications
Product code LA-AR01-FTIR-OEM010 -
060 - 4TE
LA-AR01-FTIR-OEM010 -
085 - 4TE
LA-AR01-FTIR-OEM010 -
120 - 4TE

LA-AR01-FTIR-OEM010 -
160 - LN2

Beam - splitter material CaF₂ CaF₂ ZnSe ZnSe
Spectral Range [cm⁻¹] 5'000 - 1'660 6'600 - 1'200 5'000 - 830 5'000 - 650
Spectral Range [μm] 2-6 1.5 - 8.5 2-12 2-16
Detector Type MCT (4 - TEC) MCT (4 - TEC) MCT (4 - TEC) MCT (LN2)
Detector Peak D*
[cm Hz¹/²/W¹]
>1x10¹¹ >8x10⁹ >4x10⁹ >5x10¹⁰
Signal - to - noise ratio >80'000:1 >40'000:1 >70'000:1
Output beam Ø 12.7mm collimated (max ~30mrad half angle)
Interferometer type Permanently aligned, double retro - reflector design
Resolution (unapodized) [cm⁻¹] 0.5, 2, 4, 8 (user selectable)
Wavenumber repeatability <10 PPM
Scan frequency >4 Hz @ 4cm⁻¹
Reference laser wavelength [nm] 850
A/D Converter 24 bit
Operating T [°C] 10 to 40
Storage T [°C] -20 to 60
Built - in light source SiC globar (1550°K)
Power requirement 12V / 40W
Communication Interface USB 2.0 / Ethernet with embedded processing
Software Interface Windows 10/11, Linux
API for controlling the instrument via our DLL
Single board computer available on request
Dimensions [mm] 165x145x82 (without dewar)
Weight [g] 2100 (without dewar)
 
Dimensions

SIMTRUM'S OEM011 is a flexible alternative to our OEM010 series. The main module features a built-in light source (SiC globar) regulated in temperature as well as our permanently aligned interferometer system. The TE-MCT detector has been moved to an external module which is ideal for configurations requiring a sampling system (short path gas cell, purged volume, etc.). Both modules are easily fixed on optical breadboards and can accommodate 30 mm cage system rods for rapid prototyping.

Features

  • Dynamically adjustable resolution:16/8/4/2cm-1 0.5 cm-1 (on request)
  • External detector module
  • Wear free moving parts for extended lifetime
  • Compatible with 30 mm cage system rods
 

Product Specifications

Product code LA-AR01-FTIR-OEM011-
060-4TE
LA-AR01-FTIR-OEM011-
085-4TE
LA-AR01-FTIR-OEM011-
120-4TE
LA-AR01-FTIR-OEM011-
160-LN2
Beam - splitter material CaF₂ ZnSe
Spectral Range [cm⁻¹] 5'000 - 1'660 6'000 - 1'200 5'000 - 830 5'000 - 650
Spectral Range [μm] 2-6 1.5 - 8.5 2-12 2-16
Detector Type MCT (4 - TEC) MCT (LN2)
Detector Peak D*
[cm Hz½/W]
>1x10¹¹ >8x10⁹ >4x10⁹ >5x10¹⁰
Signal to noise ratio > 80'000:1 >40'000:1 >70'000:1
Output beam Ø 12.7mm collimated (max ~30mrad half angle)
Interferometer type Permanently aligned, double retro-reflector design
Resolution (unapodized) [cm⁻¹] 0.5, 2, 4, 8 (user selectable)
Wavenumber repeatability <10 PPM
Scan frequency >4 Hz @ 4cm⁻¹
Reference laser wavelength [nm] 850
A/D Converter 24 bit
Operating T [°C] 10 to 40
Storage T [°C] -20 to 60
Built - in light source SiC globar (1550°K)
Power requirement 12V / 30W (interferometer), 12V / 10W (detector module)
Communication Interface USB 2.0 / Ethernet with embedded processing
Software Interface Windows 10/11, Linux
API for controlling instrument via our DLL
Single board computer available on request
Dimensions [mm] 165x145x82 (interferometer),93x75x66 (detector module, without dewar)
Weight [g] 2100 (interferometer),400 (detector module, without dewar)
 
Dimensions

Common Path Module

The OEM-PART-CMP is an input/output accessory that can be mounted on our OEM010 series. The common path module features a beamsplitter that allows to guide the modulated beam output by the instrument and the light returning from the sample along the same optical path. This accessory coupled to our parabolic reflector for diffuse measurement (OEM-PART-DRP) offers a high-throughput, free-space solution for measuring diffuse and specular reflection in the MID-IR over a broad spectral range, without being limited to the transparency regions of CIR and PIR optical fiber.

Common path module operating principle.

 

Illustration of the OEM-PART-DRP focusing power.

FTIR OEM010 module mounted with the OEM-PART-CMP and
the OEM-PART-DRP for diffuse reflection measurement.

 

Specifications

Product code OEM-PART-CMP OEM-PART-DRP
Internal optics ZnSe beamsplitter Gold parabolic reflector
Output Collimated Focused
Working distance up to 1m 10mm (to focus from edg)

 

Liquid Cell Module

The liquid cell module (OEM-PART-LCX) has been originally developed for application in high performance liquid chromatography (HPLC). However, the application range is much broader - it can be used as a standalone transmission cell for liquid or even high pressure gases. The OEM-PART-LCX is a high pressure, chemically and heat resistant cell for liquids spectroscopy. The cell has been tested to function up to 210 Bars and 180°C. The cell’s body is made of L316 stainless steel (Hastelloy available on request). The optical path length can be set in the range 0.5mm-3.0mm. The wetted surfaces are: gold, sapphire (as a standard), stainless steel (or Hastelloy) and carbon. The choice of these materials makes it particularly suitable for spectroscopy in the transmission windows of organic solvents. The cell can be installed on a tubular extender, and thus it can be inserted inside a thermostat (for example directly next to an HPLC cell) avoiding the re-mixing of the separated mixtures.

Specifications

Product code OEM-PART-LCX
Path length 0.5 to 3 mm (chosen and fixed)
Internal volume <15 μL
Total transmission <90% (with air inside)
Internal temperature [°C] 20-180
Mirrors gold coating
Window material Sapphire
Transmission range [μm] 2-6 (Sapphire)
Liquid inlet/outlet Waters compatible fitting with 1/16" capillaries
Power requirement 35 W @ 110-230 VAC or 12 VDC
Dimensions [mm] 73x25Ø (without extender)

 

Application case

A typical example of industrial application based on the OEM010 is shown here below. This customer driven configuration features a short path flow cell, designed to withstand high pressure (> 100 bar) fluids while placed in a high temperature environment. The modulated light emitted by the OEM010 is efficiently coupled to the cell thanks to a homemade accessory that enables a common-path configuration.


FT-IR spectroscopy: high resolution measurements

Introduction

Fourier Transform infrared (FT-IR) spectrometers have proven to be efficient and reliable tools for a large variety of applications targeting the near infrared (NIR) and mid-infrared (MIR) regions of the electromagnetic spectrum. One of the most critical specification of FT-IR spectrometers is their spectral resolution , as this defines the scale of the features to be distinguished e.g. in the absorbance spectrum of a gas. It is thus quite natural to wish for the highest achievable resolution when purchasing an FT-IR spectrometer. Due to their operational mode, achieving high resolution measurements using FT-IR spectrometers is however not entirely straightforward. This technical note explains the main limits of high resolution FT-IR measurements.

 

Fig .1 Simplified FT-IR setup

 

A simplified FT-IR is depicted in Fig.1. It consists of a beamsplitter, a fixed mirror and a movable mirror. Light from a purely monochromatic light source is split in two beams, assumedly in equal parts (50% beamsplitter). Each beam bounces back on either mirror (fixed or movable) before being recombined and focused onto the detector. When the movable mirror is at the same distance from the beamsplitter as the fixed mirror, both beams travel the same distance and recombine in-phase, yielding constructive interference. By displacing the moving mirror by a distance ℓ, one introduces an optical path difference (OPD) between the two beams Δ given by:Δ=2ℓ.

Upon recombination at the detector, the optical intensity as a function of OPD is given by: I(0)=0.5I0[1+cos(2πν0∆)]=IDC+IAC(∆).

Where I0 is the source intensity at wavenumber ν0 (the wavenumber is the reciprocal of the wavelength). The AC part of the interference record is labelled IAC(Δ) and is called the interferogram. For a purely monochromatic source (as considered here), the interferogram is a pure cosine function.

 

Fig 2. Interferogram of a purely monochromatic light source

 

Here the wavenumber (or equivalently the wavelength) of the source as well as its intensity can be retrieved from a direct observation of the interferogram (amplitude and period of the cosine function). For a broadband source, the interferogram IAC(Δ) and spectrum I0(ν) of the source are related via a Fourier transform operation:

I0(v)=∫∆maxIAC(∆)cos(2πν0∆)d∆

Obviously, the OPD cannot be made arbitrarily large and has to reach a value Δmax that is defined by technological design. Given the nature of the relationship between the interferogram and the spectrum (Fourier transform), it turns out that Δmax also defines the achievable spectral resolution. To a first approximation, the spectral resolution Δν of an FT-IR is given by:

∆ν=(∆max)-1

and is often expressed in cm-1. So why not simply increase the maximum OPD to enhance the spatial resolution of an instrument ? While this is true, special care has to be considered when operating at high resolution. As explained hereafter, the mirror maximum displacement is limited by the divergence of the system and the dimensions of the detector.

 

 

HR measurement: effect of beam divergence

We consider the exact same setup as in Fig.1. The beam divergence is accounted for by observing the behavior of the so called "extreme ray", which makes an angle α with respect to the "central ray" discussed previously.

 

 

Fig 3. FT-IR setup with a divergent source

 

 

The two extreme rays (reflected from either the fixed or the moving mirror) hit the lens with an angle α, unlike the central ray which hits the lens at normal incidence. They are thus focused on another point on the detector. Moreover, their OPD is shorter than for the central ray:

ext=2ℓcos(α)

The larger the angle α, the greater the difference with the central ray OPD Δcen=2ℓ. Consider now the case where the difference in OPD between the central ray and the extreme ray is equal to one half of the source wavelength, that is:

cen-∆ext=2ℓ[1-cos(α)]=λ/2

In this scenario, when the central rays are in phase, then the extreme rays are out of phase (and vice versa). Consequently, the intensity over the detector surface follows the profile shown in Fig. 4.

 

Fig 4. Intensity over the detector surface due to a highly diverging beam

 

 

Since the detector yields a single value that corresponds to the average intensity received on its surface, the signal detected in this case corresponds to the average optical intensity only, and all information regarding the interference signal vanishes. Practically speaking, the interferogram will start losing contrast as the moving mirror is scanned as shown in Fig. 5.

 

 

Fig 5. Loss in interferogram contrast due to a diverging beam

 

 

This effect is naturally existing in all interferometers based instruments (such as FT-IR) and cannot be avoided. It can however be properly managed by appropriately trading-off the parameters involved in equation (6), namely :

  • Δν: the effect is more pronounced for high resolution measurements due to the larger OPD required.
  • α: the effect is more pronounced for a highly diverging beam.
  • λ: the effect is more pronounced at short wavelengths (large wavenumbers).

 

For most applications in solids and liquids, the size of the observable features is typically broader than 2cm-1, and high resolution (HR) measurements performed at 0.5cm-1 are usually not required. In addition, these would prove challenging due to the added contrast loss described in this document. HR measurements might still be a viable option for specific applications, such as e.g. laser characterization, where the highly collimated laser beam prevents the dramatic loss of the interferogram contrast.


1.What resolution should I use for my application?

In FTIR, resolution is traded-off with two other experimental metrics that are acquisition time and signal-to-noise ratio (SNR). Increasing resolution, meaning reducing the resolution parameter number, will result in longer acquisition time, and poorer SNR. In general, it is recommended to work at the "worst" possible resolution, that is the limit resolution that allows to distinguish the features of the sample or substance that you are characterizing. Liquids and solids present broader features than gases or gas mixtures and can generally be probed with standard resolution instruments (down to 2cm-1). Gas analysis or light sources characterization (typically lasers) usually benefit from a sharper resolution of 0.5cm-1.

 

2.How is the equivalent wavelength resolution calculated?

Due to its working principle, FT-IR provides uniformly sampled spectra in the form of wavenumber (ν) within a given spectral range, with the unit of cm-1. Wavenumber is simply defined as the reciprocal of wavelength (λ). The resolution of a FT-IR is a constant wavenumber (Δν), but varies with the wavelength (Δ λ) due to the inverse relationship between these two units. The conversion between wavenumbers resolution and wavelengths resolution is Δλ=λ2 · Δν, as shown in the following figure:


 

3.What is the acquisition rate of this spectrometer?

The acquisition rate varies with the resolution. At the standard resolution of (4cm-1), the scanning rate is ~5Hz, and at the high resolution of (0.5cm-1), the scanning rate is ~1Hz, that is, the scanning rate is inversely proportional to the resolution.

 

 

4.What are the differences between DLADTGS detectors and MCT detectors?

DLADTGS is based on the pyroelectric effect. When exposed to infrared radiation, its temperature will change, causing the polarization inside the crystal to change. MCT is a bandgap type photoconductive detector. DLADTGS has a wider spectral response range (up to 18-20 μm), and MCT detectors utilize thermoelectric cooling to achieve higher sensitivity, which can suppress dark current and improve their signal-to-noise ratio.

 

 

5.How much better is the performance of LN4 cooled detectors than that of MCT cooled detectors?

The SNR of the LN4 cooling system is approximately ten times that of the MCT cooling system.

 

 

6.Why is the performance of the Fourier transform spectrometer superior to that of the dispersive grating spectrometer?

The performance of a grating spectrometer mainly depends on the slit and detector. Due to the different dark noise of each pixel point, additional noise will be introduced during measurement. FTIR spectrometers are generally superior to dispersive grating spectrometers due to their higher light throughput, better signal-to-noise ratio, higher spectral resolution and wider wavelength range. These advantages make FTIR spectrometers the preferred choice in many applications, especially in places where high sensitivity and accuracy are required.

 

 

7.Can an FTIR spectrometer be used to measure pulsed laser?

Sure, but the power of the laser must be limited to avoid irreversible damage to the detector. The average power shall not exceed 25mW, and the peak power of pulses shorter than 1µs shall not exceed 100W. It is recommended to use a set of fixed or variable attenuators to adjust the optical power to avoid detector saturation. Secondly, the repetition frequency of the laser must exceed 25khz to avoid numerical artifacts (aliasing) in the measured spectrum.

 

 

8.Can the concentration of the substance being measured be obtained directly?

No. A spectrometer can only provide the measured spectrum. Users must obtain the concentration of substances in the sample through specific algorithms and calibration data.

 

 

9.Can this spectrometer be used for mineral identification?

The FT-NIR spectrometer is highly suitable for mineral identification. FT-NIR is capable of generating high-quality and high-resolution (better than 1nm) reflection spectra within the spectral range of 900-2550nm (SWIR) within a few seconds.


Related products

Model Wavelength Range Resolution Detector  
  FT-NIR spectrometer 900-2500 nm 2/4/8 cm-1(user selectable) Extended type InGaAs PIN photodiode, 2TE cooled
  FT-MIR spectrometer 200-16000 nm 0.5/2/4/8cm-1(user selectable) MCT (4-TE cooled)
MCT (LN2 cooled)
DLATGS
  Fiber coupled FT-IR spectrometer 200-16000 nm 2/4/ 8cm-1 (user selectable) InGaAs (2-TE cooled)
MCT (4-TE cooled)
MCT (LN2 cooled)
  VIS-NIR-FIB spectrometer 350-2500 nm <1.5 nm silicon array detector (3648 pixels) 16-bit ADC.extended range InGaAs photodiode, 2TE cooled, 24-bit ADC.
  VIS-NIR-DR spectrometer 360-2500 nm 5 nm Extended range InGaAs detector

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Compare Model Drawings & Specs Availability Reference Price
(USD)
LA-AR01-FTIR-OEM010-060 -4TE
Spectral Range :2-6 μm ,Detector Peak D*: >1x10¹¹ cm Hz¹/²W⁻¹ , Signal - to - noise ratio: >80'000:1 , Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks $27008.00
LA-AR01-FTIR-OEM010-085-4TE
Spectral Range: 1.5 - 8.5 μm, Detector Peak D* : >8x10⁹ cm Hz¹/²W⁻¹ ,Signal - to - noise ratio: >40'000:1 ,Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks $27008.00
LA-AR01-FTIR-OEM010-120-4TE
Spectral Range: 2 - 12 μm ,Detector Peak D*: >4x10⁹ cm Hz¹/²W⁻¹ ,Signal - to - noise ratio : >40'000:1 ,Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks $27008.00
LA-AR01-FTIR-OEM010-160-LN2
Spectral Range: 2 - 16 μm ,Detector Peak D*: >5x10¹⁰ cm Hz¹/²W⁻¹ ,Signal - to - noise ratio : >70'000:1, Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks $29568.00
LA-AR01-FTIR - OEM01-060-4TE
Spectral Range :2 - 6 μm Detector Peak D* :>1x10¹¹ cm Hz¹/²W⁻¹ Signal - to - noise ratio :> 80'000:1 Resolution (unapodized) :0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks Request for quote
LA-AR01-FTIR-OEM011-085-4TE
Spectral Range:1.5 - 8.5 μm, Detector Peak D*: >8x10⁹ cm Hz¹/²W⁻¹ ,Signal - to - noise ratio: >40'000:1, Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks Request for quote
LA-AR01-FTIR - OEM011-120-4TE
Spectral Range:2-12 μm ,Detector Peak D* :>4x10⁹ cm Hz¹/²W⁻¹ ,Signal - to - noise ratio :>40'000:1 ,Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks Request for quote
LA-AR01-FTIR-OEM011-160-LN2
Spectral Range:2-16 μm ,Detector Peak D* :>5x10¹⁰ cm Hz¹/²W⁻¹ ,Signal - to - noise ratio:>70'000:1, Resolution (unapodized) : 0.5, 2, 4, 8 cm⁻¹ (user selectable)
4-6 Weeks Request for quote

FTIR-ACCS.LCX - Parameter

OEM-PART-DRP - Parameter

OEM-PART-CMP  - Parameter

LA-AR01-FTIR-OEM011-160-LN2 - Parameter

LA-AR01-FTIR - OEM011-120-4TE - Parameter

LA-AR01-FTIR-OEM011-085-4TE - Parameter

LA-AR01-FTIR - OEM01-060-4TE - Parameter

LA-AR01-FTIR-OEM010-160-LN2 - Parameter

LA-AR01-FTIR-OEM010-120-4TE - Parameter

LA-AR01-FTIR-OEM010-085-4TE - Parameter

LA-AR01-FTIR-OEM010-060 -4TE - Parameter

FTIR-ACCS.LCX - Download

OEM-PART-DRP - Download

OEM-PART-CMP  - Download

LA-AR01-FTIR-OEM011-160-LN2 - Download

LA-AR01-FTIR - OEM011-120-4TE - Download

LA-AR01-FTIR-OEM011-085-4TE - Download

LA-AR01-FTIR - OEM01-060-4TE - Download

LA-AR01-FTIR-OEM010-160-LN2 - Download

LA-AR01-FTIR-OEM010-120-4TE - Download

LA-AR01-FTIR-OEM010-085-4TE - Download

LA-AR01-FTIR-OEM010-060 -4TE - Download

Accessories

Compare Model Drawings & Specs Availability Reference Price
(USD)
OEM-PART-CMP
Internal optics:ZnSe beamsplitte ,Output:Collimated, Working distance:up to 1m
4-6 Weeks $5465.00
OEM-PART-DRP
Internal optics:Gold parabolic reflector,Output:Focused,Working distance:10mm (to focus from edg)
4-6 Weeks $5465.00
FTIR-ACCS.LCX
Path length:0.5 to 3 mm ,Transmission range:2-6 μm, Power requirement:35 W @ 110-230 VAC or 12 VDC, Dimensions :73x25Ø mm
4-6 Weeks Request for quote