Soft X-ray / XUV / VUV Spectroscopy Our soft X-ray / XUV / VUV spectrograph features aberration-corrected flat-field imaging and is available with three gratings covering the spectral ranges 1-17 nm (1240-73 eV), 5-80 nm (248-15.5 eV) and 24-200 nm (51.7-6.2 eV). In order to maximize light collection, the spectrometer can be used without an entrance slit over a variety of source distances, with 3-17nm, 10-80 nm and 24-200nm spectral coverage. Its modular design is able to match different experimental geometries and configurations. It features an integra ted slit holder, gate valve and filter insertion unit, as well as motorized grating positioning along 3 axes. |  |
EVEREST
Key Product Features: Flat-field grazing-incidence spectrograph Wavelength coverage with single gratings: - Soft X-Ray: 1-17 nm (73-1240 eV) - XUV: 5-80 nm (15-248 eV) - VUV: 30-200 nm (6-41 eV) - Motorized three grating version possible |
Operation with and without entrance slit
Adapters for different geometry options
Integrated gate valve and filter insertion unit Operating pressure <10-6 mbar Oil-free pump system for stand-alone vacuum operation optionally available Flexible choice of detectors: X-ray CCD camera or MCP camera system User-friendly acquisition and viewer software, including post-processing tools. |
| Grating 1 | Grating 2
| Grating 3 |
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| Wavelength range | 1-6 nm | 3-17 nm | 5-20 nm | 10-60 nm | 25-80 nm | 80-200 nm | 30-200 nm |
| Photon energy range | 207-1240 eV | 73-413 eV | 62-248 eV | 21-124 eV | 15-50 eV | 6-15 eV | 6-41 eV |
| Operation mode | entrance slit | slit-less | entrance slit | slit-less | slit-less | entrance slit | slit-less |
| Source distance* | any | 0.4-0.6 m | any | 0.4-0.6 m | 0.5-1.5 m | any | 2-10 m |
| Resolution | 0.01 nm | 0.03 nm | 0.02 nm | 0.09 nm | 0.1 nm | 0.05 nm | 0.2 nm |
Sample Measurement:
As a sample measurement, the image below demonstrates the capabilities of our soft X-ray / XUV / VUV spectrograph and software. It shows the acquired image with a soft X-ray / XUV CCD camera, containing the high harmonic spectrum generated by the interaction of a single femtosecond laser pulse with a gas target and subsequent spectral filtering. Post-processing tools are also provided to calibrate, merge and analyse large amount of raw data, as shown below. The final XUV spectrum resolves the finest substructures inherent to the generation process.
Screenshot of our user-friendly software displaying the Corresponding calibrated spectrum in wavelength and energy.
measurement of high-harmonic generated radiation in
the XUV photon range.