SIMTRUM Photonics Store

IRS Labkit

IRS Labkit Specification 

Broadband filters Option  & Optical Emission Vs. Angle 

• Complements detector filter
• Eliminates background signal and improves S/N ratio
• Protects the IR source in harsh environments
• Prevents parasitic influence of the sample gas (for tightly sealed broadband filter installation)

Custom Reflector

• Optimization of the emission distribution with Zemax

True black body radiation (wavelength from 2 μm to 14 μm)

High emissivity

• A unique thin film process creates a pure black body structure with emissivity close to 1.

Fast electrical modulation and high modulation depth MEMS technology 

• offers the possibility to achieve thin and low-mass membrane with short time constant, enabling IR-source to be modulated at high frequency with high modulation depth.

High electrical input power to optical output efficiency

• Due to the black surface, the IR source has excellent electrical to optical conversion efficiency. The black body surface guarantees maximized emissivity while the thin membrane is responsible for optimized heat flux.

Efficiency optimization by heat flux simulation.

Reliability of the MEMS structure
• The semiconductor MEMS manufacturing technology guarantees high reliability and quality of the IR sources. In addition to the strict quality control system during wafer-level manufacturing, every single IR source is subjected to a final burn-in and test.

• The Mean Time To Failure (MTTF) for membrane breakage of the IR source is based on a statistical analysis of lifetime data collected from several years of reliability testing. Reliability of the membrane breakage depends greatly on the type of packaging, the electrical input power and the operating mode.

Main Measurement Principles:

Non-Dispersive InfraRed (NDIR) principle
Non-Dispersive InfraRed spectroscopy utilizes a broadband infrared source covering the entire wavelength spectrum needed to measure a large variety of gases.  The specific wavelengths desired to measure the gas(es) of interest are selected with narrow band pass filters. The radiation is absorbed by the gas resulting in a signal decrease which is proportional to the gas concentration inside the sample volume. Thermopiles or pyroelectric detectors are commonly used for this spectroscopy technique.

Photo-Acoustic Spectroscopy (PAS) principle

When infrared radiation is absorbed, the absorbing gas is heated. This heating causes a thermal expansion which, in turn, is responsible for a pressure increase in the sample volume. When the radiation is switched off, the gas cools down and the pressure decreases accordingly. With a pulsed IR source, a pressure wave e.g. soundwave is created which can be detected with a microphone. The higher the concentration of the gas of interest (appropriate wavelength has to be chosen with filters), the higher the signal. PAS is not limited to gases but can also be applied to liquids and solids.

Attenuated Total Reflectance (ATR) principle
When radiation is totally reflected from an interface a small part of it will be transmitted into the adjacent medium. This evanescent wave experiences an exponential decay with penetration depths in the order of the wavelength. The amount of light that is coupled into this evanescent wave depends on the difference of refractive indices of the two adjacent media. In ATR spectroscopy, a crystal made of a high refractive index material serves as the light guiding medium. The sample, usually a liquid, is brought into contact so that the evanescent wave can interact with it. The appropriate wavelength is chosen with a narrow band pass filter. Depending on the state or quality of the sample, more or less light is coupled out and the signal on the detector then changes accordingly. Line arrays of thermopiles or pyroelectric detectors are frequently applied in these setups.

Product Portfolio & Brochures

 English: IR LED Chip

产品册中文: IR LED Chip

Type	*WD (top of refl.)/Power in < 20° angle	Broadband filter	Cap / Reflector	Measurement principles	Product photo
EMIRS200
TO-39 Chip on Header	No collimation / 12%	No	No	NDIR, PAS
TO-39 Standard TO-Cap	No collimation / 12%	No	CAP 0-53/40-0	NDIR, PAS
TO-39 Low Profile TO-Cap	No collimation / 12.3%	No	CAP 0-45/28-0	NDIR, PAS
TO-39 Standard Reflector 1	5 – 15 mm / 60%	Yes	REF W-55/40-0	NDIR, ATR
TO-39 Standard Reflector 2	0 – 7 mm / 54%	No	REF W-40/43-0	NDIR, ATR
TO-39 Standard Reflector 3	10 – 30 mm / 82%	Yes	REF W-90/151-0	NDIR, ATR
TO-39 Standard Reflector 4	No collimation / 15.7%	Yes	CAP W-36/12-0	NDIR, PAS
EMIRS50
TO-46 Chip on Header	No collimation / 12%	No	No	NDIR, PAS
TO-46 Standard TO-Cap	No collimation / 12%	No	CAP 0-30/25-N-0	NDIR, PAS
TO-46 Standard Reflector 5	No collimation / 17%	Yes	CAP W14/13-0-0	NDIR, PAS
TO-46 Standard Reflector 6	10 – 30 mm / 81%	No	REF W57-50-M-00	NDIR, PAS
TO-46 Standard Reflector 7	5 – 20 mm / 90%	No	REF W30-41-M-00	NDIR
Customized Products	Custom	Custom	Custom	NDIR, PAS, ATR

Electrical/Optical Characteristics

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